Influence of the sample morphology on total reflection X-ray fluorescence analysis

Powder Diffraction

Volumn 24, Issue 2, 2009, Pages 140-144

  Horntrich, C ^a   Meirer, F ^a   Streli, C ^a   Kregsamer, P ^a   Pepponi, G ^b   Zoeger, N ^a   Wobrauschek, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b ITC IRST   (Italy)

Author keywords

Absorption effects; Quantification; TXRF

Indexed keywords

ABSORPTION EFFECTS; ABSORPTION PHENOMENA; FLUORESCENCE INTENSITIES; LINEAR CALIBRATION; QUALITATIVE AND QUANTITATIVE ANALYSIS; QUANTIFICATION; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS; TXRF;

ARSENIC; COMPUTER SIMULATION; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; X RAY ANALYSIS;

LIGHT ABSORPTION;

EID: 67650091708     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.3131804     Document Type: Article

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