Grazing exit versus grazing incidence geometry for x-ray absorption near edge structure analysis of arsenic traces

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Meirer, F ^a   Pepponi, G ^b   Streli, C ^a   Wobrauschek, P ^a   Zoeger, N ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b FONDAZIONE BRUNO KESSLER   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

GRAZING EXITS; GRAZING INCIDENCES; INCIDENT BEAMS; NANOGRAMS; NORMAL INCIDENCES; PATH LENGTHS; SELF-ABSORPTION EFFECTS; TRACE AMOUNTS; X RAY ABSORPTION NEAR-EDGE STRUCTURES; X- RAY ABSORPTION FINE STRUCTURE ANALYSIS; X-RAY FLUORESCENCES; XAFS;

ABSORPTION; ABSORPTION SPECTRA; ARSENIC; COMPUTATIONAL GEOMETRY; LIGHT ABSORPTION; TRACE ANALYSIS; X RAY ABSORPTION;

X RAY ANALYSIS;

EID: 65249125735     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3106086     Document Type: Article

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