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Journal of Analytical Atomic Spectrometry

Volumn 24, Issue 5, 2009, Pages 611-621

Quantitative analysis in confocal micro-PIXE - General concept and layered materials

(8) Sokaras, Dimosthenis a Karydas, Andreas Germanos a Malzer, Wolfgang b,e Schütz, Roman b Kanngießer, Birgit b Grlj, Nataša c,d Pelicon, Primož c Žitnik, Matjaz c

a INSTITUTE OF NUCLEAR PHYSICS (Greece)

b TECHNISCHE UNIVERSITÄT BERLIN (Germany)

c JO EF STEFAN INSTITUTE (Slovenia)

d Primorska Institute for Natural Science and Technology (Slovenia)

e Bruker AXSMicroanalysis (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM ENERGIES; CHARACTERISTIC X-RAYS; CONCENTRATION GRADIENTS; CONFOCAL GEOMETRIES; DETECTION ANGLES; DIFFERENTIAL PIXE; EXPERIMENTAL PARAMETERS; LAYERED MATERIALS; MICRO BEAMS; MICRO-PIXE; MINOR ELEMENTS; POLYCAPILLARY; QUANTITATIVE ANALYSIS; SPATIAL RESOLUTIONS; SPATIALLY RESOLVED; STRUCTURED MATERIALS; THEORETICAL MODELS; X-RAY DETECTORS; X-RAY LENS; X-RAY OPTICS;

CHEMICAL ANALYSIS; COMPUTATIONAL GEOMETRY; LENSES; OPTICAL INSTRUMENTS; X RAY APPARATUS;

X RAY ANALYSIS;

EID: 65349090102 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b817100a Document Type: Article

Times cited : (15)

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