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Journal of Analytical Atomic Spectrometry

Volumn 24, Issue 7, 2009, Pages 979-982

Total reflection X-ray fluorescence selenium analysis after reduction and quartz reflector adsorption

(2) Aretaki, Ioanna Nikol I a Kallithrakas Kontos, Nikolaos G a

a TECHNICAL UNIVERSITY OF CRETE (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS PROCESS; ASCORBIC ACIDS; COLLOID ADSORPTION; COLLOID SUSPENSIONS; DETECTION LIMITS; EXPERIMENTAL PARAMETERS; LOW CONCENTRATIONS; PURE WATER; QUARTZ SURFACES; TOTAL REFLECTION X-RAY FLUORESCENCE; TRACE LEVEL; WATER SOLUTIONS; X RAY FLUORESCENCE;

ADSORPTION; COLLOID CHEMISTRY; ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; KETONES; ORGANIC ACIDS; OXIDE MINERALS; QUARTZ; SEAWATER; SELENIUM; TRACE ANALYSIS;

SUSPENSIONS (FLUIDS);

EID: 67649742286 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b900962k Document Type: Article

Times cited : (10)

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