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Volumn 74, Issue 1, 2009, Pages 292-296
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The interaction between atoms of Au and Cu with clean Si(1 1 1) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations
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Author keywords
Grazing incidence X ray fluorescence (GIXRF) analysis; Semiconductor surface; Total X ray reflection
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Indexed keywords
ADSORPTION SITE;
CU ATOMS;
EXPERIMENTAL DATA;
GRAZING INCIDENCE;
GRAZING INCIDENCE X-RAY FLUORESCENCE (GIXRF) ANALYSIS;
METAL ATOMS;
OPTIMIZED GEOMETRIES;
SEMICONDUCTOR SURFACE;
SI (1 1 1);
SILICON SURFACES;
STRONG INTERACTION;
THEORETICAL CALCULATIONS;
TOTAL X-RAY REFLECTION;
X RAY FLUORESCENCE ANALYSIS;
ADSORPTION;
ATOMS;
BINDING ENERGY;
BINDING SITES;
ELECTROMAGNETIC WAVES;
FLUORESCENCE;
ISOMERS;
SYNCHROTRON RADIATION;
SYNCHROTRONS;
X RAY ANALYSIS;
X RAYS;
SURFACE ANALYSIS;
COPPER;
GOLD;
SILICON;
ABSORPTION;
ARTICLE;
BIOLOGICAL MODEL;
CHEMICAL STRUCTURE;
CHEMISTRY;
INSTRUMENTATION;
METABOLISM;
METHODOLOGY;
SPECTROMETRY;
SURFACE PROPERTY;
SYNCHROTRON;
THEORETICAL MODEL;
ABSORPTION;
COPPER;
GOLD;
MODELS, BIOLOGICAL;
MODELS, MOLECULAR;
MODELS, THEORETICAL;
MOLECULAR STRUCTURE;
SILICON;
SPECTROMETRY, X-RAY EMISSION;
SURFACE PROPERTIES;
SYNCHROTRONS;
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EID: 68949187951
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2009.06.021 Document Type: Article |
Times cited : (7)
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References (23)
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