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Volumn 74, Issue 1, 2009, Pages 292-296

The interaction between atoms of Au and Cu with clean Si(1 1 1) surface: A study combining synchrotron radiation grazing incidence X-ray fluorescence analysis and theoretical calculations

Author keywords

Grazing incidence X ray fluorescence (GIXRF) analysis; Semiconductor surface; Total X ray reflection

Indexed keywords

ADSORPTION SITE; CU ATOMS; EXPERIMENTAL DATA; GRAZING INCIDENCE; GRAZING INCIDENCE X-RAY FLUORESCENCE (GIXRF) ANALYSIS; METAL ATOMS; OPTIMIZED GEOMETRIES; SEMICONDUCTOR SURFACE; SI (1 1 1); SILICON SURFACES; STRONG INTERACTION; THEORETICAL CALCULATIONS; TOTAL X-RAY REFLECTION; X RAY FLUORESCENCE ANALYSIS;

EID: 68949187951     PISSN: 13861425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.saa.2009.06.021     Document Type: Article
Times cited : (7)

References (23)
  • 23
    • 33845201491 scopus 로고    scopus 로고
    • (in Chinese)
    • Du Z.G. Univ. Chem. 20 (2005) 50 (in Chinese)
    • (2005) Univ. Chem. , vol.20 , pp. 50
    • Du, Z.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.