Picoliter droplet deposition using a prototype picoliter pipette: control parameters and application in micro X-ray fluorescence

Analytical Chemistry

Volumn 82, Issue 1, 2010, Pages 297-306

  Fittschen, Ursula E A ^a,b   Havrilla, George J ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL PARAMETERS; CORRELATION COEFFICIENT; FOCAL SPOT SIZE; HEWLETT-PACKARD; INK-JET PRINTER; LIGHT MICROSCOPY; LIMIT OF DETECTION; LINEAR RESPONSE; MATRIX EFFECTS; MICRO X-RAY FLUORESCENCE; MICROLITERS; MULTI-ELEMENT; MULTI-ELEMENT SOLUTIONS; NANOLITERS; PICOGRAM LEVEL; PICOLITER DROPLETS; PICOLITER VOLUMES; PICOLITERS; REFERENCE MATERIAL; SIZE AND SHAPE; STANDARD DEVIATION; THERMAL INKJET;

ATOMIC FORCE MICROSCOPY; CONTROL SYSTEM ANALYSIS; ELECTRONICS PACKAGING; EVAPORATION; FLUORESCENCE; NICKEL DEPOSITS; PRINTERS (COMPUTER); PRINTING PRESSES; VAPORS;

DEPOSITS;

EID: 75749088040     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac901979p     Document Type: Article

References (37)

1. Hauschild, S.; Lipprandt, U.; Rumplecker, A.; Borchert, U.; Rank, A.; Schubert, R.; Förster, S. Small 2005, 12, 1177-1180.
2. Xu, T.; Gregory, C. A.; Molnar, P.; Cui, X.; Jalota, S.; Bhaduri, S. B.; Boland, T. Biomaterials 2006, 27, 3580-3588.
3. de Gans, B.-J.; Duineveld, P.; Schubert, U. S. Adv. Mater. 2004, 16, 203-213.
4. Fittschen, U. E. A.; Bings, N. H.; Hauschild, S.; Foerster, S.; Kiera, A. F.; Karavani, E.; Froemsdorf, A.; Thiele, J.; Falkenberg, G. Anal. Chem. 2008, 80, 1967-1977.
5. Miller, T. C.; Havrilla, G. J. X-Ray Spectrom. 2004, 33, 101-106.
6. Miller, T. C.; Hastings, E. P.; Havrilla, G. J. X-Ray Spectrom. 2006, 35 (2), 131-136.
7. Miller, T. C.; Sparks, C. M.; Havrilla, G. J.; Beebe, M. R. Spectrochim. Acta, Part B 2004, 59, 1117-1124.
8. Sparks, C. M.; Gondran, C. H.; Havrilla, G. J.; Hastings, E. P. Spectrochim. Acta, Part B 2006, 61, 1091-1097.
9. Fittschen, U. E. A.; Meirer, F.; Streli, C.; Wobrauschek, P.; Thiele, J.; Falkenberg, G.; Pepponi, G. Spectrochim. Acta, Part B 2008, 63, 1489-1495.
10. Fittschen, U. E. A.; Hauschild, S.; Amberger, M. A.; Lammel, G.; Streli, C.; Förster, S.; Wobrauschek, P.; Jokubonis, C.; Pepponi, G.; Falkenberg, G.; Broekaert, J. A. C. Spectrochim. Acta, Part B 2006, 61, 1098-1104.
11. Bjeoumikhov, A.; Langhoff, N.; Bjeoumikhova, S.; Wedell, R. Rev. Sci. Instrum. 2005, 76 (6), 172-178.
12. Gao, N.; Ponomarev, Y. X-Ray Spectrom. 2003, 186-194.
13. Schroer, C. G.; Lengeler, B. Phys. Rev. Lett. 2003, 94 (5), 054802.
14. Worley, C.; Havrilla, G. J.; Gao, N.; Xiao, Q.-F. Ad. X-Ray Anal. 2000, 42, 26-35.
15. Wobrauschek, P.; Frank, B.; Zoeger, N.; Streli, C.; Cernohlawek, N.; Jokubonis, C.; Hoefler, H. Adv. X-Ray Anal. 2005, 48, 229-235.
16. Zoeger, N.; Wobrauschek, P.; Streli, C.; Pepponi, G.; Roschger, P.; Falkenberg, G.; Osterode, W. X-Ray Spectrom. 2003, 34 (2), 140-143.
17. Guguianu, O.;Toeroek, S.; Osan, J.; Kocsonya, A.; Szokefalvi-Nagy, Z. Rom. J. Phys. 2003, 48 (7-10), 863-873.
18. Fleissner, G.; Holtkamp-Rötzler, E.; Hanzlik, M.; Winklhofer, M.; Fleissner, G.; Petersen, N.; Wiltschko, W. J. Comp. Neurol. 2003, 458, 350-360.
19. Kemner, K. M.; Kelly, S. D.; Lai, B.; Maser, J.; O'Loughlin, E. J.; Sholto-Douglas, D.; Cai, Z.; Schneegurt, M. A.; Kulpa, C. F.; Nealson, K. H. Science 2004, 306 (5696), 686-687.
20. Claes, M.; Van Ham, R.; Janssens, K.; Van Grieken, R.; Klockenkamper, R.; von Bohlen, A. Adv. X-Ray Anal. 1999, 41, 262-277.
21. Smit, Z.; Janssens, K.; Bulska, E.; Wagner, B.; Kos, M.; Lazar, I. Nucl. Instrum. Methods Phys. Res., Sect. B: Beam Interactions with Materials and Atoms 2005, 239 (1-2), 94-99.
22. Padilla, R.; Schalm, O.; Janssens, K.; Arrazcaeta, R.; Van Espen, P. Anal. Chim. Acta 2003, 535 (1-2), 201-211.
23. Linke, R.; Schreiner, M.; Demortier, G.; Alram, M.; Winter, H. Compr. Anal. Chem. 2004, 42, 605-633.
24. Fredrickx, P.; de Ryck, I.; Janssens, K.; Schryvers, D.; Petit, J.-P.; Doecking, H. X-Ray Spectrom. 2004, 33 (5), 326-333.
25. Hahn, O.; Oltrogge, D.; Bevers, H. Archaeometry 2004, 46 (2), 273-282.
26. Hahn, O.; Malzer, W.; Kanngiesser, B.; Beckhoff, B. X-Ray Spectrom. 2004, 33 (4), 234-239.
27. Maire, E.; Bufflere, J. Y.; Mokso, R.; Cloetens, P.; Ludwig, W. Mater. Sci. Forum 2006, 519-521 (Pt. 2), 1367-1372.
28. Constantinescu, B.; Bugoi, R.; Simon, R.; Staub, S. NATO Sci. Ser., II: Mathematics, Physics and Chemistry 2006, 199, 373-380 (Advanced Radiation Sources and Applications).
29. Miller, T. C.; Langley DeWitt, H.; Havrilla, G. J. Spectrochim. Acta, Part B 2003, 60, 1458-1467.
30. Vincze, L.; Somogyi, A.; Osan, J.; Vekemans, B.; Toeroek, S.; Janssens, K.; Adams, F. Anal. Chem. 2002, 74 (5), 1128-1135.
31. Frisia, S.; Borsato, A.; Susini, J.; Somogyi, A. Archaeometry 2005, 47 (2), 209-219.
32. Mans, C.; Simons, C.; Hanning, S.; Janßen, A.; Alber, D.; Radtke, M.; Reinholz, U.; Bühler, A.; Krevenschmidt, M. X-Ray Spectrom. 2009, 38 (1), 52-57.
33. Beckhoff, B.; Kolbe, M.; Hahn, O.; Karydas, A. G.; Zarkadas, Ch.; Sokaras, D.; Mantler, M. X-Ray Spectrom. 2008, 37 (4), 462-465.
34. Osterode, W.; Falkenberg, G.; Höftberger, R.; Wrba, F. Spectrochim. Acta Part B 2007, 62, 682-688.
35. Bukowiecki, N.; Lienemann, P.; Zwicky, C. N.; Furger, M.; Richard, A.; Falkenberg, G.; Rickers, K.; Grolimund, D.; Borca, C.; Hill, M.; Gehrig, R.; Baltensperger, U. Spectrochim. Acta, Part B 2008, 63, 929-938.
36. Patterson, B. M.; Havrilla, G. J.; DeFriend, K. A. Microsc. Today 2008, 16 (4), 38-41.
37. Humphreys, W. J. Evaporation and condensation. In Physics of the air, J. B. Lippincott Company: Philadelphia, 1920.