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Volumn 38, Issue 3, 2009, Pages 175-181
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Self-enhancement effects on XRF K-lines due to natural width
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Author keywords
[No Author keywords available]
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Indexed keywords
MOLECULAR PHYSICS;
ABSORPTION EDGES;
ATOMIC NUMBERS;
ELECTRONIC TRANSITION;
ENERGY WIDTH;
ENHANCEMENT EFFECTS;
K-LINES;
LONG TAIL;
LORENTZIAN DISTRIBUTIONS;
PURE ELEMENTS;
SELF-ENHANCEMENT EFFECT;
ATOMS;
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EID: 67249100393
PISSN: 00498246
EISSN: 10974539
Source Type: Journal
DOI: 10.1002/xrs.1137 Document Type: Article |
Times cited : (8)
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References (15)
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