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Volumn 64, Issue 8, 2009, Pages 736-743

Crystal optics for hard-X-ray spectroscopy of highly charged ions

(32)  Beyer, H F a   Attia, D b   Banas, D c   Le Bigot, E O b   Bosch, F a   Dousse, J Cl d   Forster E e   Gumberidze, A a   Hagmann, S a   Hess S a   Hoszowska, J d   Indelicato, P b   Jagodzinski, P c   Kozhuharov, Chr a   Krings, Th g   Liesen, D a   Ma, X h   Manil, B i   Mohos, I g   Pajek, M c   more..


Author keywords

Fast beam spectroscopy; Position sensitive detectors; X ray optics; X ray spectroscopy

Indexed keywords

CRYSTAL OPTICS; FAST-BEAM SPECTROSCOPY; GAMMA RAY SOURCES; HIGHLY CHARGED HEAVY IONS; HIGHLY CHARGED IONS; LAUE GEOMETRY; MOVING SOURCE; POSITION-SENSITIVE DETECTORS; TWO-DIMENSIONAL; X-RAY DETECTOR; X-RAY ENERGIES; X-RAY SOURCES;

EID: 69249215160     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2009.05.019     Document Type: Article
Times cited : (16)

References (12)
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  • 6
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    • 15944384143 scopus 로고    scopus 로고
    • an X-ray optics software toolkit
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  • 9
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    • Two-dimensional microstrip germanium detector for the spectroscopy of hard X-ray transitions
    • Protić D., Stöhlker T., Krings T., Mohos I., and Spillmann U. Two-dimensional microstrip germanium detector for the spectroscopy of hard X-ray transitions. IEEE Trans. Instr. Meas. 52 (2005) 3194-3198
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.