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Volumn 82, Issue 2, 2009, Pages 449-454

A new portable XRD/XRF instrument for non-destructive analysis

Author keywords

Data acquisition; Data analysis; Diffractometers; X ray diffraction; X ray fluorescence

Indexed keywords


EID: 70649099306     PISSN: 00111643     EISSN: 1334417X     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (24)

References (19)
  • 6
    • 0003459528 scopus 로고
    • R. E Van Grieken and A. A. Markowicz Eds, Marcel Dekker, New York
    • R. E Van Grieken and A. A. Markowicz (Eds), Handbook of X-Ray Spectrometry, Marcel Dekker, New York, 1993.
    • (1993) Handbook of X-Ray Spectrometry
  • 16
    • 70649084667 scopus 로고    scopus 로고
    • http://www.assing.it


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.