Determination of the real transmission of an x-ray lens for micro-focus XRF at the SEM by coupling measurement with calculation of scatter spectra

X-Ray Spectrometry

Volumn 38, Issue 3, 2009, Pages 216-221

  Hodoroaba, V D ^a   Procop, M ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITED STATES; OPTICAL INSTRUMENT LENSES; SCANNING ELECTRON MICROSCOPY; TUBES (COMPONENTS); X RAY TUBES;

EXCITATION SPECTRUM; FUNDAMENTAL EQUATIONS; MICRO FOCUS; SCANNING ELECTRONS; SPECTRA'S; TRANSMISSION FUNCTION; X RAY FLUORESCENCE ANALYSIS; X RAY LENS; X-RAY EXCITATION; X-RAY TUBE SPECTRUM;

FLUORESCENCE;

EID: 67249090088     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1151     Document Type: Article

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