Direct multielement determination of trace elements in boron carbide powders by total reflection X-ray fluorescence spectrometry and analysis of the powders by ICP atomic emission spectrometry subsequent to sample digestion

Journal of Analytical Atomic Spectrometry

Volumn 24, Issue 11, 2009, Pages 1517-1523

  Amberger, Martin A ^a   Broekaert, José A C ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC EMISSION SPECTROMETRY; CONCENTRATION LEVELS; CONCENTRATION OF; CORRELATION COEFFICIENT; DETECTION LIMITS; DIRECT DETERMINATION; ICP-OES; INTERNAL STANDARDS; MULTIELEMENT DETERMINATION; PH VALUE; POLYETHYLENIMINES; RELATIVE STANDARD DEVIATIONS; SAMPLE DIGESTION; SIGNAL-TO-BACKGROUND RATIO; SLURRY CONCENTRATION; SLURRY SAMPLING; TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRIES; TRACE ANALYTES; WET CHEMICALS;

BORON; CALCIUM; CHROMIUM; CONCENTRATION (PROCESS); ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; GALLIUM; INDUCTIVELY COUPLED PLASMA; MANGANESE; MANGANESE COMPOUNDS; PARTICLE SIZE; POWDERS; SLURRIES; SPECTROMETRY; STANDARDS; STATISTICS; TRACE ANALYSIS; TRACE ELEMENTS; ZETA POTENTIAL;

BORON CARBIDE;

EID: 70350234923     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b906417f     Document Type: Article

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