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Volumn 267, Issue 5, 2009, Pages 832-841

Quality assessment system for curved crystal X-ray optics

Author keywords

Curved crystal monochromators; Diffraction; Focused X ray beam; Optical alignment; X ray optics

Indexed keywords

ALIGNMENT; DEFECTS; DIFFRACTION; ELECTRON TUBES; LIGHT; MONOCHROMATORS; X RAY OPTICS; X RAY TUBES; X RAYS;

EID: 61549136418     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.01.014     Document Type: Article
Times cited : (11)

References (34)
  • 9
    • 61549090967 scopus 로고    scopus 로고
    • Curved Optical Device and Method of Fabrication,
    • US Patent, No: US 6285506B1
    • Z. Chen, Curved Optical Device and Method of Fabrication, US Patent, No: US 6285506B1, 2001.
    • (2001)
    • Chen, Z.1
  • 26
    • 61549084436 scopus 로고    scopus 로고
    • F. Cerrina, M.S. del Rio, in: M. Bass et al. (Ed.), Handbook of Optics, third ed., 5, McGraw-Hill, to be published.
    • F. Cerrina, M.S. del Rio, in: M. Bass et al. (Ed.), Handbook of Optics, third ed., Vol. 5, McGraw-Hill, to be published.
  • 31
    • 61549110624 scopus 로고    scopus 로고
    • Ph.D. Thesis, University at Albany, SUNY
    • N. Mail, Ph.D. Thesis, University at Albany, SUNY, 2003.
    • (2003)
    • Mail, N.1
  • 33
    • 61549084111 scopus 로고    scopus 로고
    • Ph.D. Thesis, University at Albany, SUNY
    • A. Bingölbali, Ph.D. Thesis, University at Albany, SUNY, 2008.
    • (2008)
    • Bingölbali, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.