Nondestructive elemental depth profiling of Japanese lacquerware 'Tamamushi-nuri' by confocal 3D-XRF analysis in comparison with micro GE-XRF

X-Ray Spectrometry

Volumn 38, Issue 5, 2009, Pages 446-450

  Nakano, Kazuhiko ^a,b   Tsuji, Kouichi ^a  

^a Osaka City University   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

3D XRF; Depth analysis; ED XRF; GE XRF; Micro XRF

Indexed keywords

X RAY ANALYSIS; X RAY OPTICS;

3D-MICRO X-RAY FLUORESCENCE; DEPTH ANALYSIS; ED-MICRO X-RAY FLUORESCENCE; GRAZING EXIT; GRAZING EXIT XRF; MICRO-MICRO X-RAY FLUORESCENCE; MICRO-X-RAY FLUORESCENCE; X-RAY FLUORESCENCE METHODS;

DEPTH PROFILING;

EID: 77950270839     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1163     Document Type: Article

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