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Volumn 38, Issue 5, 2009, Pages 417-428

The comparative analytical performance of the Beagle 2 X-ray spectrometer for in situ geochemical analysis on Mars

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL GEOCHEMISTRY; BENCHMARKING; SIGNAL TO NOISE RATIO; TRACE ELEMENTS; UNCERTAINTY ANALYSIS;

EID: 77951756710     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1198     Document Type: Article
Times cited : (6)

References (44)
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    • (Eds H. H. Kieffer, B. M. Jakosky, C. W. Snyder, M. S. Matthews). The University of Arizona Press: Tucson, Arizona USA
    • J. Longhi, E. Knittle, J. R. Holloway, H. Wänke. The Bulk Composition, Mineralogy and Internal Structure of Mars. In Mars (Eds H. H. Kieffer, B. M. Jakosky, C. W. Snyder, M. S. Matthews). The University of Arizona Press: Tucson, Arizona, USA, 1992.
    • (1992) Mars
    • Longhi, J.1    Knittle, E.2    Holloway, J.R.3    Wänke, H.4
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    • Spectrum Evaluation
    • 2nd edn (Eds R. E. Van. Greiken, A. A. Markowicz). Marcel. Dekker Inc. : New York, USA
    • P. VanEspen,K. Janssens.SpectrumEvaluation.InHandbookofX-ray Spectrometry, 2nd edn, (Eds R. E. Van. Greiken, A. A. Markowicz). Marcel. Dekker Inc.: New York, USA, 2002.
    • (2002) Hand book of X-ray Spectrometry
    • VanEspen, P.1    Janssens, K.2
  • 33
    • 0032771398 scopus 로고    scopus 로고
    • M. Thompson, Analyst 1999, 124(7), 991.
    • (1999) Analyst , vol.124 , Issue.7 , pp. 991
    • Thompson, M.1
  • 36
    • 19944387052 scopus 로고    scopus 로고
    • Quantification of infinitely thick specimens by XRF analysis
    • 2nd edn, (Eds: R. E. Van. Greiken, A. A. Markowicz). Marcel. Dekker Inc. : New York, USA
    • J.L.Vries de B.A.R.Vrebos. Quantification of infinitely thick specimens by XRF analysis. In Handbook of X-ray Spectrometry, 2nd edn, (Eds: R. E. Van. Greiken, A. A. Markowicz). Marcel. Dekker Inc.: New York, USA, 2002.
    • (2002) Handbook of X-ray Spectrometry
    • Vries de, J.L.1    Vrebos, B.A.R.2
  • 42
    • 0345803765 scopus 로고    scopus 로고
    • Energy-dispersive X-ray fluorescence analysis using X-ray tube excitation
    • (Eds. R. E. Van. Grieken and A. A. Markowicz). 2nd edn Marcel Dekker Inc. : New York, USA
    • A. T. Ellis. Energy-dispersive X-ray fluorescence analysis using X-ray tube excitation. In Handbook of X-ray Spectrometry, (Eds. R. E. Van. Grieken and A. A. Markowicz). 2nd edn Marcel Dekker Inc.: New York, USA, 2002.
    • (2002) Handbook of X-ray Spectrometry
    • Ellis, A.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.