Synchrotron-based investigation of iron precipitation in multicrystalline silicon

Superlattices and Microstructures

Volumn 45, Issue 4-5, 2009, Pages 168-176

  Seifert, W ^a,b   Vyvenko, O ^b,c   Arguirov, T ^a,b   Kittler, M ^a,b   Salome, M ^d   Seibt, M ^e   Trushin, M ^b  

^a IHP   (Germany)

^b BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

^c ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Defects; Metal precipitates; Recombination; Silicon; Synchrotron X ray microprobe techniques

Indexed keywords

ABSORPTION; FLUORESCENCE MICROSCOPY; GRAIN BOUNDARIES; IRON OXIDES; POLYSILICON; SILICIDES; SYNCHROTRONS; X RAY ABSORPTION; X RAYS;

BEAM LINES; CAST MULTICRYSTALLINE SILICONS; DETECTION SENSITIVITIES; IRON CLUSTERS; IRON PRECIPITATIONS; IRON SILICIDES; METAL PRECIPITATES; MICRO SPECTROSCOPIES; MULTI-CRYSTALLINE SILICONS; RECOMBINATION; SYNCHROTRON X-RAY MICROPROBE TECHNIQUES; X RAY ABSORPTION NEAR-EDGE STRUCTURES; X-RAY ABSORPTIONS; X-RAY BEAMS; X-RAY FLUORESCENCE MICROSCOPIES;

CAST IRON;

EID: 62949179555     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2008.11.025     Document Type: Article

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