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Volumn 81, Issue 12, 2009, Pages 4946-4954

Secondary fluorescence enhancement in confocal X-ray microscopy analysis

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE INTENSITY; EXCITATION CHANNELS; EXPERIMENTAL PARAMETERS; MATHEMATICAL FORMALISM; MICRO BEAMS; MICRO PARTICLES; MICRO X-RAY FLUORESCENCE; REPRESENTATIVE CASE; SECONDARY FLUORESCENCE; THEORETICAL MODELS; X RAY INTENSITY; X RAY MICROSCOPY;

EID: 67249096335     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac900688n     Document Type: Article
Times cited : (22)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.