Application of surface chemical analysis tools for characterization of nanoparticles

Analytical and Bioanalytical Chemistry

Volumn 396, Issue 3, 2010, Pages 983-1002

  Baer, D R ^a   Gaspar, D J ^b   Nachimuthu, P ^a   Techane, S D ^c   Castner, D G ^c  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Catalysts; Nanoparticles; Nanotechnology; X ray spectroscopy (XPS XRF EDX)

Indexed keywords

ANALYSIS METHOD; LOW-ENERGY ION SCATTERING; SCANNING TUNNELING MICROSCOPY (STM); SHAPE INSTABILITY; SURFACE CHEMICAL ANALYSIS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; XPS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; CATALYSIS; CATALYSTS; CHEMICAL ANALYSIS; CHEMICALS; ELECTRON ENERGY LOSS SPECTROSCOPY; ION BEAM LITHOGRAPHY; NANOPARTICLES; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SPECTRUM ANALYSIS; X RAY ANALYSIS; X RAY SPECTROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

NANOPARTICLE;

ATOMIC FORCE MICROSCOPY; CHEMISTRY; MASS SPECTROMETRY; METHODOLOGY; NANOTECHNOLOGY; REVIEW; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE; MICROSCOPY, SCANNING TUNNELING; NANOPARTICLES; NANOTECHNOLOGY; PHOTOELECTRON SPECTROSCOPY; SPECTROMETRY, MASS, SECONDARY ION; SURFACE PROPERTIES;

EID: 76749136693     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-009-3360-1     Document Type: Review

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