-
1
-
-
84942809685
-
-
The International Technology Roadmap for Semiconductors, ITRS, NearTerm and Long-Term, Interconnect, Semiconductor Industry Association, Austin, TX (2006)
-
The International Technology Roadmap for Semiconductors, ITRS, NearTerm and Long-Term, Interconnect, Semiconductor Industry Association, Austin, TX (2006).
-
-
-
-
8
-
-
0025645327
-
-
The Electrochemical Society, Pennington, NJ, J. Ruzyllo, R.E. Novaks (Eds.)
-
Heyns M., Hasenack C., De Keersmaecker R., Falster R. Proc. of the 1st Int. Symp. on Cleaning Technology in Semiconductor Device Manufacturing 1990, 90-99:293. The Electrochemical Society, Pennington, NJ. J. Ruzyllo, R.E. Novaks (Eds.).
-
(1990)
Proc. of the 1st Int. Symp. on Cleaning Technology in Semiconductor Device Manufacturing
, vol.90-99
, pp. 293
-
-
Heyns, M.1
Hasenack, C.2
De Keersmaecker, R.3
Falster, R.4
-
13
-
-
84858360253
-
-
Plenum Press, New York, NY, C.R. Helms, B.E. Deal (Eds.)
-
2 Interface 1988, 189. Plenum Press, New York, NY. C.R. Helms, B.E. Deal (Eds.).
-
(1988)
2 Interface
, pp. 189
-
-
Ourmazd, A.1
Bevk, J.2
-
16
-
-
84882764957
-
-
Pennington, NJ, J.C. Beans (Ed.)
-
Mikata V., Inoue T., Takasu S., Usami T., Ohta T., Hirano H. Proc. of the 1st Symp. on Si Molecular Beam Epitaxy 1990, 45. Pennington, NJ. J.C. Beans (Ed.).
-
(1990)
Proc. of the 1st Symp. on Si Molecular Beam Epitaxy
, pp. 45
-
-
Mikata, V.1
Inoue, T.2
Takasu, S.3
Usami, T.4
Ohta, T.5
Hirano, H.6
-
17
-
-
0347024499
-
-
Ogawa H., Terada N., Sugiyama K., Moriki K., Miyata N., Aoyama T., Sugino R., Ito T., Hattori T. Appl. Surf. Sci. 1992, 56-58:836.
-
(1992)
Appl. Surf. Sci.
, vol.56-58
, pp. 836
-
-
Ogawa, H.1
Terada, N.2
Sugiyama, K.3
Moriki, K.4
Miyata, N.5
Aoyama, T.6
Sugino, R.7
Ito, T.8
Hattori, T.9
-
18
-
-
0242717295
-
-
Sugiyama K., Igarashi T., Moriki K., Nagasawa V., Aoyama T., Sugino R., Ito T., Hattori T. Jpn. J. Appl. Phys. 1990, 29:L2401.
-
(1990)
Jpn. J. Appl. Phys.
, vol.29
, pp. L2401
-
-
Sugiyama, K.1
Igarashi, T.2
Moriki, K.3
Nagasawa, V.4
Aoyama, T.5
Sugino, R.6
Ito, T.7
Hattori, T.8
-
19
-
-
6244253461
-
-
The Electrochemical Society, Pennington, NJ, T.J. Shaffer, D.K. Schroeder (Eds.)
-
Yablonovitch E., Gmitter T.J. Diagnostic Techniques for Semiconductor Materials and Devices 1988, 88-20:207. The Electrochemical Society, Pennington, NJ. T.J. Shaffer, D.K. Schroeder (Eds.).
-
(1988)
Diagnostic Techniques for Semiconductor Materials and Devices
, vol.20-88
, pp. 207
-
-
Yablonovitch, E.1
Gmitter, T.J.2
-
20
-
-
0003739856
-
-
Academic Press, New York, NY, L.H. Little (Ed.)
-
Kiselev A.V., Lygin V.I. Infrared Spectra of Adsorbed Apecies 1966, 213. Academic Press, New York, NY. L.H. Little (Ed.).
-
(1966)
Infrared Spectra of Adsorbed Apecies
, pp. 213
-
-
Kiselev, A.V.1
Lygin, V.I.2
-
21
-
-
36049034301
-
-
Onsia B., Caymax M., Conard T., DeGendt S., DeSmedt E., Dalabie A., Gottschalk C., Green M., Heyns M., Lin S., Mertens P., Tsai W., Vinckier C. Solid State Phenomema 2004, 103-104:19.
-
(2004)
Solid State Phenomema
, vol.103-104
, pp. 19
-
-
Onsia, B.1
Caymax, M.2
Conard, T.3
DeGendt, S.4
DeSmedt, E.5
Dalabie, A.6
Gottschalk, C.7
Green, M.8
Heyns, M.9
Lin, S.10
Mertens, P.11
Tsai, W.12
Vinckier, C.13
-
23
-
-
0343677398
-
-
Schaefer J.A., Frankel D.J., Stucki E., Gopel W., Lapeyre G.J. Surf. Sci. 1984, 139:L209.
-
(1984)
Surf. Sci.
, vol.139
, pp. L209
-
-
Schaefer, J.A.1
Frankel, D.J.2
Stucki, E.3
Gopel, W.4
Lapeyre, G.J.5
-
24
-
-
0348207287
-
-
Nagasawa Y., Ishida H., Takayagi T., Ishitani A., Kuroda H. Solid State Electron. 1990, 33:129.
-
(1990)
Solid State Electron.
, vol.33
, pp. 129
-
-
Nagasawa, Y.1
Ishida, H.2
Takayagi, T.3
Ishitani, A.4
Kuroda, H.5
-
26
-
-
84858360253
-
-
Plenum Press, New York, NY, C.R. Helms, B.E. Deal (Eds.)
-
2 Interface 1988, 401. Plenum Press, New York, NY. C.R. Helms, B.E. Deal (Eds.).
-
(1988)
2 Interface
, pp. 401
-
-
Hahn, P.O.1
Grundner, M.2
Schnegg, A.3
Jacob, H.4
-
27
-
-
0021851279
-
-
The Electrochemical Society, Pennington, NJ
-
Schnegg A., Lampert I., Jacob H. Electrochemical Society Extended Abstracts 1985, 85-91:394. The Electrochemical Society, Pennington, NJ.
-
(1985)
Electrochemical Society Extended Abstracts
, vol.85-91
, pp. 394
-
-
Schnegg, A.1
Lampert, I.2
Jacob, H.3
-
28
-
-
34547477575
-
-
Ourmazd A., Taylor D.W., Rentschler J.A., Bevk J. Phys. Rev. Lett. 1987, 59:213.
-
(1987)
Phys. Rev. Lett.
, vol.59
, pp. 213
-
-
Ourmazd, A.1
Taylor, D.W.2
Rentschler, J.A.3
Bevk, J.4
-
30
-
-
0024714662
-
-
Mishima H., Yasui T., Mizuniwa T., Abe M., Ohmi T. IEEE Trans. Semiconductor Manuf 1989, 2:69.
-
(1989)
IEEE Trans. Semiconductor Manuf
, vol.2
, pp. 69
-
-
Mishima, H.1
Yasui, T.2
Mizuniwa, T.3
Abe, M.4
Ohmi, T.5
-
31
-
-
0026370260
-
-
Oiso, Japan
-
Miyashita M., Itano M., Imaoka T., Kawanabe I., Ohmi T. Technical Digest of the 1991 Symp. on VLSI Technology 1991, 45. Oiso, Japan.
-
(1991)
Technical Digest of the 1991 Symp. on VLSI Technology
, pp. 45
-
-
Miyashita, M.1
Itano, M.2
Imaoka, T.3
Kawanabe, I.4
Ohmi, T.5
-
32
-
-
0026366788
-
-
Ohmi T., Kotani K., Teramoto A., Miyashita M. IEEE Electron Dev. Lett. 1991, 12:652.
-
(1991)
IEEE Electron Dev. Lett.
, vol.12
, pp. 652
-
-
Ohmi, T.1
Kotani, K.2
Teramoto, A.3
Miyashita, M.4
-
33
-
-
0026837569
-
-
Ohmi T., Miyashita M., Itano M., Imaoka T., Kawanabe I. IEEE Trans. Electron Dev. 1992, 39:537.
-
(1992)
IEEE Trans. Electron Dev.
, vol.39
, pp. 537
-
-
Ohmi, T.1
Miyashita, M.2
Itano, M.3
Imaoka, T.4
Kawanabe, I.5
-
34
-
-
84954092004
-
-
Verhaverbeke S., Meuris M., Mertens M.M., Heyns, Philipossian A., Graf D., Schnegg A. Proc. Int. Electron Devices Meeting 1991, 71.
-
(1991)
Proc. Int. Electron Devices Meeting
, pp. 71
-
-
Verhaverbeke, S.1
Meuris, M.2
Mertens, M.M.3
Heyns4
Philipossian, A.5
Graf, D.6
Schnegg, A.7
-
36
-
-
33845566733
-
-
Morita M., Ohmi T., Hasegawa E., Kawakami M., Suma K. Appl. Phys. Lett. 1989, 55:562.
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 562
-
-
Morita, M.1
Ohmi, T.2
Hasegawa, E.3
Kawakami, M.4
Suma, K.5
-
37
-
-
0025545628
-
-
Sendai, Japan
-
Sunada T., Yasaka T., Takakura M., Sugiyama T., Miyazaki S., Hirose M. Ext. Abstracts of the Conf On Solid State Devices and Materials 1990, 1071. Sendai, Japan.
-
(1990)
Ext. Abstracts of the Conf On Solid State Devices and Materials
, pp. 1071
-
-
Sunada, T.1
Yasaka, T.2
Takakura, M.3
Sugiyama, T.4
Miyazaki, S.5
Hirose, M.6
-
38
-
-
0026104703
-
-
Heyns M., Hasenack C., De Keersrnaeker R., Falster R. Microelectron Eng. 1991, 10:235.
-
(1991)
Microelectron Eng.
, vol.10
, pp. 235
-
-
Heyns, M.1
Hasenack, C.2
De Keersrnaeker, R.3
Falster, R.4
-
39
-
-
0025625647
-
-
The Electrochemical Society, Pennington, NJ, H.R. Huff, K.G. Barraclough (Eds.)
-
Ohsawa A., Honda K., Takizawa R., Nakanishi T., Aoki M., Toyokura N. Semiconductor Silicon 1990, 90-7:601. The Electrochemical Society, Pennington, NJ. H.R. Huff, K.G. Barraclough (Eds.).
-
(1990)
Semiconductor Silicon
, vol.7-90
, pp. 601
-
-
Ohsawa, A.1
Honda, K.2
Takizawa, R.3
Nakanishi, T.4
Aoki, M.5
Toyokura, N.6
-
40
-
-
84942805909
-
-
Oxford, England
-
Murrell M., Solield C., Sugden S., Verhaverbeke S., Heyns M.M., Welland M., Golen B. Proc. Silicon Ultra-Clean Processing Workshop 1991, Oxford, England.
-
(1991)
Proc. Silicon Ultra-Clean Processing Workshop
-
-
Murrell, M.1
Solield, C.2
Sugden, S.3
Verhaverbeke, S.4
Heyns, M.M.5
Welland, M.6
Golen, B.7
-
42
-
-
0005380481
-
-
Tokyo, Japan, R. Uedas (Ed.)
-
Ishizaka A., Nakagawa K., Shiraki Y. Second Int. Symp. on MBE and Clean Surface Related Techniques 1982, 183. Tokyo, Japan. R. Uedas (Ed.).
-
(1982)
Second Int. Symp. on MBE and Clean Surface Related Techniques
, pp. 183
-
-
Ishizaka, A.1
Nakagawa, K.2
Shiraki, Y.3
-
46
-
-
0039657435
-
-
Plenum Press, New York, NY, P.E. Kane, G.B. Larrabee (Eds.)
-
Harrick N.J., Beckmann K.H. Characterization of Solid Surfaces 1974, 243. Plenum Press, New York, NY. P.E. Kane, G.B. Larrabee (Eds.).
-
(1974)
Characterization of Solid Surfaces
, pp. 243
-
-
Harrick, N.J.1
Beckmann, K.H.2
-
48
-
-
0019621881
-
-
Imura T., Mogi K., Hiraki A., Nakashima S., Mitsuishi A. Solid State Comm. 1981, 40:161.
-
(1981)
Solid State Comm.
, vol.40
, pp. 161
-
-
Imura, T.1
Mogi, K.2
Hiraki, A.3
Nakashima, S.4
Mitsuishi, A.5
-
49
-
-
0020813563
-
-
Miyasato T., Abe Y., Tokumura M., Imura T., Hiraki A. Jpn. J. Appl. Phys. 1983, 22:L580.
-
(1983)
Jpn. J. Appl. Phys.
, vol.22
, pp. L580
-
-
Miyasato, T.1
Abe, Y.2
Tokumura, M.3
Imura, T.4
Hiraki, A.5
-
50
-
-
0001213089
-
-
Trucks G.W., Raghavachari K., Higashi G.S., Chabal Y.J. Phys. Rev. Lett. 1990, 65:504.
-
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 504
-
-
Trucks, G.W.1
Raghavachari, K.2
Higashi, G.S.3
Chabal, Y.J.4
-
53
-
-
84957226828
-
-
Weinberger B.R., Deckman H.W., Yablonovitch E., Gmitter T., Kobasz W., Garoff S. J. Vac. Sci. Technol. 1985, A3:887.
-
(1985)
J. Vac. Sci. Technol.
, vol.A3
, pp. 887
-
-
Weinberger, B.R.1
Deckman, H.W.2
Yablonovitch, E.3
Gmitter, T.4
Kobasz, W.5
Garoff, S.6
-
55
-
-
0001451172
-
-
Weinberger B.R., Peterson G.G., Eschrich T.C., Krasinski H.A. J. Appl. Phys. 1986, 60:3232.
-
(1986)
J. Appl. Phys.
, vol.60
, pp. 3232
-
-
Weinberger, B.R.1
Peterson, G.G.2
Eschrich, T.C.3
Krasinski, H.A.4
-
56
-
-
0014794693
-
-
Kern W. RCA Rev. 1970, 31:207.
-
(1970)
RCA Rev.
, vol.31
, pp. 207
-
-
Kern, W.1
-
57
-
-
0000703152
-
-
Yablonovitch E., Allara D.L., Chang C.C., Gmitter T., Bright T.B. Phys. Rev. Lett. 1986, 57:249.
-
(1986)
Phys. Rev. Lett.
, vol.57
, pp. 249
-
-
Yablonovitch, E.1
Allara, D.L.2
Chang, C.C.3
Gmitter, T.4
Bright, T.B.5
-
59
-
-
45249126098
-
-
Grunthaner P.J., Grunthaner E.J., Fathauer R.W., Lin T.L., Hecht M.H., Bell L.D., Kaiser W.J. Thin Solid Films 1989, 183:197.
-
(1989)
Thin Solid Films
, vol.183
, pp. 197
-
-
Grunthaner, P.J.1
Grunthaner, E.J.2
Fathauer, R.W.3
Lin, T.L.4
Hecht, M.H.5
Bell, L.D.6
Kaiser, W.J.7
-
61
-
-
0039706334
-
-
New York, NY, G.W. Rubloff, G. Lucovskys (Eds.)
-
Grundner M., Schulz R. AIP Conf Proc. No 167 1988, 167:329. New York, NY. G.W. Rubloff, G. Lucovskys (Eds.).
-
(1988)
AIP Conf Proc. No 167
, vol.167
, pp. 329
-
-
Grundner, M.1
Schulz, R.2
-
63
-
-
21544465957
-
-
Takahagi T., Nagai I., Jshitani A., Kuroda H., Nagasawa Y. J. Appl. Phys. 1988, 64:3516.
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 3516
-
-
Takahagi, T.1
Nagai, I.2
Jshitani, A.3
Kuroda, H.4
Nagasawa, Y.5
-
65
-
-
36549099751
-
-
Burrows V.A., Chabal Y.J., Higashi G.S., Raghavachari K., Christman S.B. Appl. Phys. Lett. 1988, 53:998.
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 998
-
-
Burrows, V.A.1
Chabal, Y.J.2
Higashi, G.S.3
Raghavachari, K.4
Christman, S.B.5
-
66
-
-
84929177658
-
-
Chabal Y.J., Higashi G.S., Raghavachari K., Burrows V.A. J. Vac. Sci. Technol. A 1989, 7:2104.
-
(1989)
J. Vac. Sci. Technol. A
, vol.7
, pp. 2104
-
-
Chabal, Y.J.1
Higashi, G.S.2
Raghavachari, K.3
Burrows, V.A.4
-
71
-
-
21544433109
-
-
Higashi G.S., Chabal Y.J., Trucks G.W., Raghavachari K. Appl. Phys. Lett. 1990, 56:656.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 656
-
-
Higashi, G.S.1
Chabal, Y.J.2
Trucks, G.W.3
Raghavachari, K.4
-
76
-
-
36749115086
-
-
Kobayashi H., Edamoto K., Onchi M., Nishijima M. J. Chem. Phys. 1983, 78:7429.
-
(1983)
J. Chem. Phys.
, vol.78
, pp. 7429
-
-
Kobayashi, H.1
Edamoto, K.2
Onchi, M.3
Nishijima, M.4
-
81
-
-
21544460483
-
-
Higashi G.S., Becker R.S., Chabal Y.J., Becker A.J. Appl. Phys. Lett. 1991, 58:1656.
-
(1991)
Appl. Phys. Lett.
, vol.58
, pp. 1656
-
-
Higashi, G.S.1
Becker, R.S.2
Chabal, Y.J.3
Becker, A.J.4
-
82
-
-
0000220481
-
-
Hessel H.E., Feltz A., Reiter M., Memmert U., Behm R.J. Chem. Phys. Lett. 1991, 186:275.
-
(1991)
Chem. Phys. Lett.
, vol.186
, pp. 275
-
-
Hessel, H.E.1
Feltz, A.2
Reiter, M.3
Memmert, U.4
Behm, R.J.5
-
83
-
-
0000417353
-
-
Becker R.S., Higashi G.S., Chabal Y.J., Becker A.J. Phys. Rev. Lett. 1990, 65:1917.
-
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 1917
-
-
Becker, R.S.1
Higashi, G.S.2
Chabal, Y.J.3
Becker, A.J.4
-
86
-
-
0009173012
-
-
Miglio L., Ruggerone P., Benedek G., Colombo L. Phys. Scr 1988, 37:768.
-
(1988)
Phys. Scr
, vol.37
, pp. 768
-
-
Miglio, L.1
Ruggerone, P.2
Benedek, G.3
Colombo, L.4
-
87
-
-
0001120931
-
-
Doak R.B., Chabal Y.J., Higashi G.S., Dumas P. J. Electron Spectr Rel. Phenom. 1990, 54-55:291.
-
(1990)
J. Electron Spectr Rel. Phenom.
, vol.54-55
, pp. 291
-
-
Doak, R.B.1
Chabal, Y.J.2
Higashi, G.S.3
Dumas, P.4
-
89
-
-
0345303216
-
-
Guyot-Sionnest P., Dumas P., Chabal Y.J., Higashi G.S. Phys. Rev. Lett. 1990, 64:2156.
-
(1990)
Phys. Rev. Lett.
, vol.64
, pp. 2156
-
-
Guyot-Sionnest, P.1
Dumas, P.2
Chabal, Y.J.3
Higashi, G.S.4
-
90
-
-
0000938312
-
-
Becker R.S., Swarzentruber B.S., Vickers J.S., Klitsner T. Phys. Rev. 1989, B39:1633.
-
(1989)
Phys. Rev.
, vol.B39
, pp. 1633
-
-
Becker, R.S.1
Swarzentruber, B.S.2
Vickers, J.S.3
Klitsner, T.4
-
92
-
-
0037158940
-
-
Garcia S.P., Bao H., Manimaran M., Hines M.A. J. Phys. Chem. 2002, B106:8258.
-
(2002)
J. Phys. Chem.
, vol.B106
, pp. 8258
-
-
Garcia, S.P.1
Bao, H.2
Manimaran, M.3
Hines, M.A.4
-
94
-
-
84942789346
-
-
(unpublished).
-
Chabal, Y.J. (unpublished).
-
-
-
Chabal, Y.J.1
-
97
-
-
0025519505
-
-
Seidel H., Csepregi L., Heuberger A., Baumgartel H. J. Electrochem. Soc. 1990, 137:3626.
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 3626
-
-
Seidel, H.1
Csepregi, L.2
Heuberger, A.3
Baumgartel, H.4
-
98
-
-
0026918115
-
-
Jakob P., Chabal Y.J., Raghavachari K., Becker R.S., Becker A.J. Surf. Sci. 1992, 275:407.
-
(1992)
Surf. Sci.
, vol.275
, pp. 407
-
-
Jakob, P.1
Chabal, Y.J.2
Raghavachari, K.3
Becker, R.S.4
Becker, A.J.5
-
100
-
-
0000300918
-
-
Hines M.A., Chabal Y.J., Harris T.D., Harris A.L. J. Chem. Phys. 1994, 101:8055.
-
(1994)
J. Chem. Phys.
, vol.101
, pp. 8055
-
-
Hines, M.A.1
Chabal, Y.J.2
Harris, T.D.3
Harris, A.L.4
-
101
-
-
0001052546
-
-
Huang Y.-C., Flidr J., Newton T.A., Hines M.A. Phys. Rev. Lett. 1998, 80:4462.
-
(1998)
Phys. Rev. Lett.
, vol.80
, pp. 4462
-
-
Huang, Y.-C.1
Flidr, J.2
Newton, T.A.3
Hines, M.A.4
-
102
-
-
33748614963
-
-
Springer, Berlin, A.A. Demkov, A. Navrotsky (Eds.)
-
Frank M.M., Chabal Y.J. Materials Fundamentals of Gate Dielectrics 2005, 367. Springer, Berlin. A.A. Demkov, A. Navrotsky (Eds.).
-
(2005)
Materials Fundamentals of Gate Dielectrics
, pp. 367
-
-
Frank, M.M.1
Chabal, Y.J.2
-
108
-
-
0031547255
-
-
Imai T., Kurioka Y., Nagataki N., Okuyama M., Hamakawa Y. Appl. Surf. Sci. 1997, 113:398.
-
(1997)
Appl. Surf. Sci.
, vol.113
, pp. 398
-
-
Imai, T.1
Kurioka, Y.2
Nagataki, N.3
Okuyama, M.4
Hamakawa, Y.5
-
109
-
-
0040184885
-
-
Morita M., Ohmi T., Hasegawa E., Kawakami M., Ohwada M. J. Appl. Phys. 1990, 68:1272.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 1272
-
-
Morita, M.1
Ohmi, T.2
Hasegawa, E.3
Kawakami, M.4
Ohwada, M.5
-
110
-
-
0000758956
-
-
Ogawa H., Ishikawa K., Inomata C., Fujimura S. J. Appl. Phys. 1996, 79:472.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 472
-
-
Ogawa, H.1
Ishikawa, K.2
Inomata, C.3
Fujimura, S.4
-
111
-
-
0000198002
-
-
Vanderzwan M.L.W., Bardwell J.A., Sproule G.I., Graham M.J. Appl. Phys. Lett. 1994, 64:446.
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 446
-
-
Vanderzwan, M.L.W.1
Bardwell, J.A.2
Sproule, G.I.3
Graham, M.J.4
-
113
-
-
78649964067
-
-
Hess G., Russell M., Gong B., Parkinson P., Ekerdt J.G. J. Vac. Sci. Technol. 1997, B15:1129.
-
(1997)
J. Vac. Sci. Technol.
, vol.B15
, pp. 1129
-
-
Hess, G.1
Russell, M.2
Gong, B.3
Parkinson, P.4
Ekerdt, J.G.5
-
116
-
-
0026258474
-
-
Kawamura K., Ishizuka S., Sakaue H., Horiike Y. Jpn. J. Appl. Phys. 1991, 30:3215.
-
(1991)
Jpn. J. Appl. Phys.
, vol.30
, pp. 3215
-
-
Kawamura, K.1
Ishizuka, S.2
Sakaue, H.3
Horiike, Y.4
-
117
-
-
84882796605
-
-
Niwano M., Kageyama J., Kurita K., Kinashi K., Takahaski I., Miyamoto N. Appl. Surf. Sci. 1996, 101:431.
-
(1996)
Appl. Surf. Sci.
, vol.101
, pp. 431
-
-
Niwano, M.1
Kageyama, J.2
Kurita, K.3
Kinashi, K.4
Takahaski, I.5
Miyamoto, N.6
-
120
-
-
0035276290
-
-
Ye S., Saito T., Nihonyanagi S., Uosaki K., Miranda P.B., Kim D., Shen Y.-R. Surf. Sci. 2001, 476:121.
-
(2001)
Surf. Sci.
, vol.476
, pp. 121
-
-
Ye, S.1
Saito, T.2
Nihonyanagi, S.3
Uosaki, K.4
Miranda, P.B.5
Kim, D.6
Shen, Y.-R.7
-
121
-
-
0030235373
-
-
Hattori T., Aiba T., Iijima E., Okube Y., Nohira H., Tate N., Katayama M. Appl. Surf. Sci. 1996, 104/105:323.
-
(1996)
Appl. Surf. Sci.
, pp. 323
-
-
Hattori, T.1
Aiba, T.2
Iijima, E.3
Okube, Y.4
Nohira, H.5
Tate, N.6
Katayama, M.7
-
123
-
-
0035952938
-
-
Kato K., Kajiyama H., Heike S., Hashizume T., Uda T. Phys. Rev. Lett. 2001, 86:2842.
-
(2001)
Phys. Rev. Lett.
, vol.86
, pp. 2842
-
-
Kato, K.1
Kajiyama, H.2
Heike, S.3
Hashizume, T.4
Uda, T.5
-
124
-
-
0033335860
-
-
Material Research Society, Pittsburg, PA, H.R. Huff, M.L. Green, T. Hattori, G. Lucovsky, C.A. Richter (Eds.)
-
Esteve A., Djafari Rouhani M., Famous P., Esteve D. MRS Symposium Proceedings Ultrathin SiO2 and High K Materials for ULSI Gate Dielectrics 1999, 567:213. Material Research Society, Pittsburg, PA. H.R. Huff, M.L. Green, T. Hattori, G. Lucovsky, C.A. Richter (Eds.).
-
(1999)
MRS Symposium Proceedings Ultrathin SiO2 and High K Materials for ULSI Gate Dielectrics
, vol.567
, pp. 213
-
-
Esteve, A.1
Djafari Rouhani, M.2
Famous, P.3
Esteve, D.4
-
125
-
-
0032155865
-
-
Sakata K., Tachibana A., Zaima S., Yasuda Y. Jpn. J. Appl. Phys. 1998, 37:4962.
-
(1998)
Jpn. J. Appl. Phys.
, vol.37
, pp. 4962
-
-
Sakata, K.1
Tachibana, A.2
Zaima, S.3
Yasuda, Y.4
-
126
-
-
36449001216
-
-
Niwano M., Kageyama J., Kurita K., Kinashi K., Takahashi I., Miyamoto N. J. Appl. Phys. 1994, 76:2157.
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 2157
-
-
Niwano, M.1
Kageyama, J.2
Kurita, K.3
Kinashi, K.4
Takahashi, I.5
Miyamoto, N.6
-
127
-
-
0030564402
-
-
Miura T., Niwano M., Shoji D., Miyamoto N. Appl. Surf. Sci. 1996, 101:454.
-
(1996)
Appl. Surf. Sci.
, vol.101
, pp. 454
-
-
Miura, T.1
Niwano, M.2
Shoji, D.3
Miyamoto, N.4
-
128
-
-
0001655806
-
-
Miura T., Niwano M., Shoji D., Miyamoto N. J. Appl. Phys. 1996, 79:4373.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 4373
-
-
Miura, T.1
Niwano, M.2
Shoji, D.3
Miyamoto, N.4
-
129
-
-
0037203087
-
-
Henrion W., Rebien M., Angermann H., Röseler A. Appl. Surf. Sci. 2002, 202:199.
-
(2002)
Appl. Surf. Sci.
, vol.202
, pp. 199
-
-
Henrion, W.1
Rebien, M.2
Angermann, H.3
Röseler, A.4
-
130
-
-
0008330122
-
-
Hersam M.C., Guisinger N.P., Lyding J.W., Thompson D.S., Moore J.S. Appl. Phys. Lett. 2001, 78:886.
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 886
-
-
Hersam, M.C.1
Guisinger, N.P.2
Lyding, J.W.3
Thompson, D.S.4
Moore, J.S.5
-
132
-
-
0035842813
-
-
Zhang X., Garfunkel E., Chabal Y.J., Christman S.B., Chaban E.E. Appl. Phys. Lett. 2001, 79:4051.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 4051
-
-
Zhang, X.1
Garfunkel, E.2
Chabal, Y.J.3
Christman, S.B.4
Chaban, E.E.5
-
134
-
-
0033337816
-
-
Chabal Y.J., Weldon M.K., Caudano Y., Stefanov B.B., Raghavachari K. Physica 1999, B274:152.
-
(1999)
Physica
, vol.B274
, pp. 152
-
-
Chabal, Y.J.1
Weldon, M.K.2
Caudano, Y.3
Stefanov, B.B.4
Raghavachari, K.5
-
137
-
-
84978436442
-
-
Zhang X., Chabal Y.J., Christman S.B., Chaban E.E., Garfunkel E. J. Vac. Sci. Technol. 2001, A19:1725.
-
(2001)
J. Vac. Sci. Technol.
, vol.A19
, pp. 1725
-
-
Zhang, X.1
Chabal, Y.J.2
Christman, S.B.3
Chaban, E.E.4
Garfunkel, E.5
-
138
-
-
84882781834
-
-
Academic Press, New York, NY
-
Sanderson R.T. Name of Book 1976, Academic Press, New York, NY.
-
(1976)
Name of Book
-
-
Sanderson, R.T.1
-
139
-
-
0026870007
-
-
Yagi Y., Imaoka T., Ksama Y., Ohmi T. IEEE Trans. Semiconductor Manuf 1992, 5:121.
-
(1992)
IEEE Trans. Semiconductor Manuf
, vol.5
, pp. 121
-
-
Yagi, Y.1
Imaoka, T.2
Ksama, Y.3
Ohmi, T.4
-
140
-
-
0027699480
-
-
Takagi N., Minami T., Furukawa T., Nishijima M. Surf. Sci. 1993, 297:L43.
-
(1993)
Surf. Sci.
, vol.297
, pp. L43
-
-
Takagi, N.1
Minami, T.2
Furukawa, T.3
Nishijima, M.4
-
142
-
-
0034228027
-
-
Kim Y.B., Tuominen M., Raaijmakers I., de Blank R., Wilhelm R., Haukka S. Electrochem. Sol. State Lett. 2000, 3:346.
-
(2000)
Electrochem. Sol. State Lett.
, vol.3
, pp. 346
-
-
Kim, Y.B.1
Tuominen, M.2
Raaijmakers, I.3
de Blank, R.4
Wilhelm, R.5
Haukka, S.6
-
149
-
-
0000269564
-
-
Queeney K.T., Weldon M.K., Chang J.P., Chabal Y.J., Gurevich A.B., Sapjeta J., Opila R.L. J. Appl. Phys. 2000, 87:1322.
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 1322
-
-
Queeney, K.T.1
Weldon, M.K.2
Chang, J.P.3
Chabal, Y.J.4
Gurevich, A.B.5
Sapjeta, J.6
Opila, R.L.7
-
151
-
-
0001593944
-
-
Weldon M.K., Stefanov B.B., Raghavachari K., Chabal Y.J. Phys. Rev. Lett. 1997, 79:2851.
-
(1997)
Phys. Rev. Lett.
, vol.79
, pp. 2851
-
-
Weldon, M.K.1
Stefanov, B.B.2
Raghavachari, K.3
Chabal, Y.J.4
-
152
-
-
5844416550
-
-
Yu B.-G., Arai E., Nishioka Y., Ohji Y., Iwata S., Ma T.P. Appl. Phys. Lett. 1990, 56:1430.
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 1430
-
-
Yu, B.-G.1
Arai, E.2
Nishioka, Y.3
Ohji, Y.4
Iwata, S.5
Ma, T.P.6
-
154
-
-
0000813328
-
-
Graf D., Grundner M., Schulz R., Muhlhoff L. J. Appl. Phys. 1990, 68:5155.
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 5155
-
-
Graf, D.1
Grundner, M.2
Schulz, R.3
Muhlhoff, L.4
-
155
-
-
0001622707
-
-
Graf D., Grundner M., Muhlhoff L., Dellith M. J. Appl. Phys. 1991, 69:7620.
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 7620
-
-
Graf, D.1
Grundner, M.2
Muhlhoff, L.3
Dellith, M.4
-
159
-
-
0038110855
-
-
Huang H.C., Wei H.L., Woo C.H., Zhang X.X. Appl. Phys. Lett. 2003, 82:4265.
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 4265
-
-
Huang, H.C.1
Wei, H.L.2
Woo, C.H.3
Zhang, X.X.4
-
160
-
-
2442512103
-
-
Bae J.W., Lim J.W., Minus K., Isshiki M. Mater. Trans. 2004, 45:877.
-
(2004)
Mater. Trans.
, vol.45
, pp. 877
-
-
Bae, J.W.1
Lim, J.W.2
Minus, K.3
Isshiki, M.4
-
165
-
-
0041817966
-
-
Das I., Mishra S.S., Agrawal N.R., Gupta S.K. J. Indian Chem. Soc. 2003, 80:351.
-
(2003)
J. Indian Chem. Soc.
, vol.80
, pp. 351
-
-
Das, I.1
Mishra, S.S.2
Agrawal, N.R.3
Gupta, S.K.4
-
166
-
-
0035927902
-
-
Latt K.M., Lee K., Osipowicz T., Lee Y.K. Mat. Sci. Eng. 2001, A83:1.
-
(2001)
Mat. Sci. Eng.
, vol.A83
, pp. 1
-
-
Latt, K.M.1
Lee, K.2
Osipowicz, T.3
Lee, Y.K.4
-
168
-
-
84882790255
-
-
Lingk C., Gross M.E., Brown W.L., Siegrist T., Coleman E., Lai W.Y.C., Miner J.F., Ritzdorf T., Turner J., Gibbons J., Klawuhn E., Wu G., Zhang F. Proc. Advanced Metallization Conference 1998, 514:293.
-
(1998)
Proc. Advanced Metallization Conference
, vol.514
, pp. 293
-
-
Lingk, C.1
Gross, M.E.2
Brown, W.L.3
Siegrist, T.4
Coleman, E.5
Lai, W.Y.C.6
Miner, J.F.7
Ritzdorf, T.8
Turner, J.9
Gibbons, J.10
Klawuhn, E.11
Wu, G.12
Zhang, F.13
-
170
-
-
0000193155
-
-
Vanasupa L., Joo Y.C., Besser P.R., Pramanick S. J. Appl. Phys. 1999, 85:2583.
-
(1999)
J. Appl. Phys.
, vol.85
, pp. 2583
-
-
Vanasupa, L.1
Joo, Y.C.2
Besser, P.R.3
Pramanick, S.4
-
177
-
-
0141831071
-
-
Hu M.H., Noda S., Okubo T., Yamaguchi Y., Komiyama H. J. Appl. Phys. 2003, 94:3492.
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 3492
-
-
Hu, M.H.1
Noda, S.2
Okubo, T.3
Yamaguchi, Y.4
Komiyama, H.5
-
183
-
-
0142011584
-
-
Ernur D., Iacopi E., Caronell L., Struyf H., Maex K. Microelectron Eng. 2003, 70:285.
-
(2003)
Microelectron Eng.
, vol.70
, pp. 285
-
-
Ernur, D.1
Iacopi, E.2
Caronell, L.3
Struyf, H.4
Maex, K.5
-
184
-
-
3142733742
-
-
Balakumar S., Wong G., Tsang C.F., Hara T., Yoo W.J. Microelectronic Eng. 2004, 75:183.
-
(2004)
Microelectronic Eng.
, vol.75
, pp. 183
-
-
Balakumar, S.1
Wong, G.2
Tsang, C.F.3
Hara, T.4
Yoo, W.J.5
-
185
-
-
0038266419
-
-
Joo Y.C., Hwang S.J., Park H. Materials Science Forum, Thermec 2003 Parts 1-5 2003, 426:3481.
-
(2003)
Materials Science Forum, Thermec 2003 Parts 1-5
, vol.426
, pp. 3481
-
-
Joo, Y.C.1
Hwang, S.J.2
Park, H.3
-
186
-
-
0028468378
-
-
Peng B., Cai M., Li G., Wu X.J. Nanostructur Mater. 1994, 4:475.
-
(1994)
Nanostructur Mater.
, vol.4
, pp. 475
-
-
Peng, B.1
Cai, M.2
Li, G.3
Wu, X.J.4
-
187
-
-
84882807911
-
-
The Electrochemical Society, Pennington, NJ
-
Joulaud M., Omnes L., Mourier T., Mayer D., Doppelt P. Extended Abstracts of the 203rd Electrochemical Society Meeting 2003, The Electrochemical Society, Pennington, NJ.
-
(2003)
Extended Abstracts of the 203rd Electrochemical Society Meeting
-
-
Joulaud, M.1
Omnes, L.2
Mourier, T.3
Mayer, D.4
Doppelt, P.5
-
188
-
-
0041911544
-
-
Maverick A.W., James A.M., Fan H., Isovitsch R.A., Stewart M.P., Azene E., Cygan Z. T. Source: ACS Symposium Series 1999, 727:100.
-
(1999)
T. Source: ACS Symposium Series
, vol.727
, pp. 100
-
-
Maverick, A.W.1
James, A.M.2
Fan, H.3
Isovitsch, R.A.4
Stewart, M.P.5
Azene, E.6
Cygan, Z.7
-
189
-
-
84882743580
-
-
The Electrochemical Society, Pennington, NJ
-
Ecke R., Riedel S., Schultz S.E., Gessner T., Lipp E., Eizenburg M. Extended Abstracts of the 203rd Electrochemical Society Meeting 2003, The Electrochemical Society, Pennington, NJ.
-
(2003)
Extended Abstracts of the 203rd Electrochemical Society Meeting
-
-
Ecke, R.1
Riedel, S.2
Schultz, S.E.3
Gessner, T.4
Lipp, E.5
Eizenburg, M.6
-
193
-
-
0001525501
-
-
Vazquez L., Albella J.M., Salvarezza R.C., Arvia A.J., Levy R.A., Perese D. Appl. Phys. Lett. 2001, 68:1285.
-
(2001)
Appl. Phys. Lett.
, vol.68
, pp. 1285
-
-
Vazquez, L.1
Albella, J.M.2
Salvarezza, R.C.3
Arvia, A.J.4
Levy, R.A.5
Perese, D.6
-
194
-
-
0035741363
-
-
Zhang D.H., Loh S.W., Li C.Y., Foo P.D., Xie J. Surf. Rev. Lett. 2001, 8:533.
-
(2001)
Surf. Rev. Lett.
, vol.8
, pp. 533
-
-
Zhang, D.H.1
Loh, S.W.2
Li, C.Y.3
Foo, P.D.4
Xie, J.5
-
196
-
-
84882774409
-
-
Shanghai, China, S. Shivashankar, A. Mane, P. Dagurs (Eds.)
-
Shivashankar S., Mane A., Dagur P. ISTC 2004 Meeting 2004, Shanghai, China. S. Shivashankar, A. Mane, P. Dagurs (Eds.).
-
(2004)
ISTC 2004 Meeting
-
-
Shivashankar, S.1
Mane, A.2
Dagur, P.3
-
197
-
-
84882792063
-
-
McGraw Hill, New York, NY, P. Van Zant (Ed.)
-
Van Zant P. Microchip Fabrication 2000, 407. McGraw Hill, New York, NY. P. Van Zant (Ed.).
-
(2000)
Microchip Fabrication
, pp. 407
-
-
Van Zant, P.1
-
200
-
-
84882769200
-
-
Pilippenko V.A., Malofeev V.M., Ponomar V.N., Mikhnyuk A.N., Borzdov V.M. J. Eng. Phys. Thermophys 2003, 76:858.
-
(2003)
J. Eng. Phys. Thermophys
, vol.76
, pp. 858
-
-
Pilippenko, V.A.1
Malofeev, V.M.2
Ponomar, V.N.3
Mikhnyuk, A.N.4
Borzdov, V.M.5
-
213
-
-
2642519869
-
-
Subramania A., Kalyana N.T., Sundaram S., Priya R., Muralidharn V.S., Vasudevan T. Bull. Electrochem. 2004, 20:49.
-
(2004)
Bull. Electrochem.
, vol.20
, pp. 49
-
-
Subramania, A.1
Kalyana, N.T.2
Sundaram, S.3
Priya, R.4
Muralidharn, V.S.5
Vasudevan, T.6
-
217
-
-
0030088391
-
-
Feng Y., Teo W.K., Siow K.S., Tan K.L., Hsieh A.K. Corrosion Sci. 1996, 38:387.
-
(1996)
Corrosion Sci.
, vol.38
, pp. 387
-
-
Feng, Y.1
Teo, W.K.2
Siow, K.S.3
Tan, K.L.4
Hsieh, A.K.5
-
218
-
-
0000710821
-
-
Feng Y., Siow K.S., Teo W.K., Tan K.L., Hsieh A.K. Corrosion 1997, 53:389.
-
(1997)
Corrosion
, vol.53
, pp. 389
-
-
Feng, Y.1
Siow, K.S.2
Teo, W.K.3
Tan, K.L.4
Hsieh, A.K.5
-
219
-
-
0242349559
-
-
Kunze J., Maurice V., Klein Strehblow H.H., Marcus P. Corrosion Sci. 2004, 46:245.
-
(2004)
Corrosion Sci.
, vol.46
, pp. 245
-
-
Kunze, J.1
Maurice, V.2
Klein Strehblow, H.H.3
Marcus, P.4
-
221
-
-
0038685801
-
-
Sobue K., Sugahara A., Nakata T., Imai H., Magaino S. Surf. Coatings Tech. 2003, 169:662.
-
(2003)
Surf. Coatings Tech.
, vol.169
, pp. 662
-
-
Sobue, K.1
Sugahara, A.2
Nakata, T.3
Imai, H.4
Magaino, S.5
-
230
-
-
0033893412
-
-
Homma Y., Kondo S., Sakuma N., Hinode K., Noguchi N., Ohashi H., Yamaguchi H., Owada N. J. Electrochem. Soc. 2000, 147:1193.
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 1193
-
-
Homma, Y.1
Kondo, S.2
Sakuma, N.3
Hinode, K.4
Noguchi, N.5
Ohashi, H.6
Yamaguchi, H.7
Owada, N.8
-
231
-
-
0034158770
-
-
Beverina A., Bernard H., Palleau J., Torres J., Tardif F. Electrochem. Sol. State Lett. 2000, 3:156.
-
(2000)
Electrochem. Sol. State Lett.
, vol.3
, pp. 156
-
-
Beverina, A.1
Bernard, H.2
Palleau, J.3
Torres, J.4
Tardif, F.5
-
232
-
-
1042275376
-
-
Szocs E., Bako I., Kosztolanyi T., Bertoti I., Kalman E. Electrochim. Acta 2004, 49:1371.
-
(2004)
Electrochim. Acta
, vol.49
, pp. 1371
-
-
Szocs, E.1
Bako, I.2
Kosztolanyi, T.3
Bertoti, I.4
Kalman, E.5
-
233
-
-
21844503608
-
-
Madkour L.H., Madkour A., Madkour E.M., Ghoneim M.M. Monatsh. Chem. 1995, 126:1087.
-
(1995)
Monatsh. Chem.
, vol.126
, pp. 1087
-
-
Madkour, L.H.1
Madkour, A.2
Madkour, E.M.3
Ghoneim, M.M.4
-
234
-
-
84882767223
-
-
M.K. Balazs (Ed.)
-
Marsh J., Pearson R., Strickland B., Moore J., Raghavan S. Semiconductor Pure Water and Chemicals Conference 2005, 155. M.K. Balazs (Ed.).
-
(2005)
Semiconductor Pure Water and Chemicals Conference
, pp. 155
-
-
Marsh, J.1
Pearson, R.2
Strickland, B.3
Moore, J.4
Raghavan, S.5
-
237
-
-
84882771194
-
-
Notoya T., Satake M., Ohtsuka T., Sato M., Schweinsberg D.P. J. Corrosion Sci. Eng. 2003, 6:C076.
-
(2003)
J. Corrosion Sci. Eng.
, vol.6
, pp. C076
-
-
Notoya, T.1
Satake, M.2
Ohtsuka, T.3
Sato, M.4
Schweinsberg, D.P.5
-
238
-
-
84942791712
-
-
Dept. Materials Science and Eng., University of Arizona
-
Tamilmani, S., Dept. Materials Science and Eng., University of Arizona (2005).
-
-
-
Tamilmani, S.1
-
240
-
-
84882736565
-
-
A. Balerna, E. Bernieri, S. Mobilios (Eds.)
-
Pizzini S., Roberts K.J., Dring I., Oldman R.J., Greaves G.N. 2nd European Conf on Progress in X-Ray Synchrotron Radiation Research 1990, 25:525. A. Balerna, E. Bernieri, S. Mobilios (Eds.).
-
(1990)
2nd European Conf on Progress in X-Ray Synchrotron Radiation Research
, vol.25
, pp. 525
-
-
Pizzini, S.1
Roberts, K.J.2
Dring, I.3
Oldman, R.J.4
Greaves, G.N.5
-
242
-
-
0026205793
-
-
Brusic V., Frisch M.A., Eldridge B.N., Noval F.P., Kaufman F.B., Rush B.M., Frankel G.S. J. Electrochem. Soc. 1991, 138:2253.
-
(1991)
J. Electrochem. Soc.
, vol.138
, pp. 2253
-
-
Brusic, V.1
Frisch, M.A.2
Eldridge, B.N.3
Noval, F.P.4
Kaufman, F.B.5
Rush, B.M.6
Frankel, G.S.7
-
244
-
-
0038238408
-
-
Yu P., Liao D.M., Luo Y.B., Chen Z.G. Corrosion 2003, 59:314.
-
(2003)
Corrosion
, vol.59
, pp. 314
-
-
Yu, P.1
Liao, D.M.2
Luo, Y.B.3
Chen, Z.G.4
-
245
-
-
85032326131
-
-
Ward E.C., Foster A.L., Weidner I.C., Glaser D.E. Corrosion 2004, 04079:1.
-
(2004)
Corrosion
, vol.4079
, pp. 1
-
-
Ward, E.C.1
Foster, A.L.2
Weidner, I.C.3
Glaser, D.E.4
-
246
-
-
0028534374
-
-
Modestov A.D., Zhou G.D., Wu Y.P., Notoya T., Schweinsberg D.P. Corrosion Sci. 1994, 36:1931.
-
(1994)
Corrosion Sci.
, vol.36
, pp. 1931
-
-
Modestov, A.D.1
Zhou, G.D.2
Wu, Y.P.3
Notoya, T.4
Schweinsberg, D.P.5
-
248
-
-
0027609643
-
-
Gonzalez S., Laz M.M., Salvarezza R.C., Arvia A.J. Corrosion 1993, 49:450.
-
(1993)
Corrosion
, vol.49
, pp. 450
-
-
Gonzalez, S.1
Laz, M.M.2
Salvarezza, R.C.3
Arvia, A.J.4
-
249
-
-
10244264739
-
-
Peters D.W., Bartosh K., Naghshshineh S., Walker E. Solid State Technol. 2004, 47:47.
-
(2004)
Solid State Technol.
, vol.47
, pp. 47
-
-
Peters, D.W.1
Bartosh, K.2
Naghshshineh, S.3
Walker, E.4
-
250
-
-
0031188528
-
-
Tommesani L., Brunoro G., Frignani A., Monticelli C., Dal Colle M. Corrosion Sci. 1997, 39:1221.
-
(1997)
Corrosion Sci.
, vol.39
, pp. 1221
-
-
Tommesani, L.1
Brunoro, G.2
Frignani, A.3
Monticelli, C.4
Dal Colle, M.5
-
251
-
-
0036604871
-
-
Huynh N., Bottle S.E., Notoya T., Trueman A., Hinton B., Schweinsberg D.P. Corrosion Sci. 2002, 44:1257.
-
(2002)
Corrosion Sci.
, vol.44
, pp. 1257
-
-
Huynh, N.1
Bottle, S.E.2
Notoya, T.3
Trueman, A.4
Hinton, B.5
Schweinsberg, D.P.6
-
252
-
-
0036407025
-
-
Bartley J., Huynh N., Bottle S.E., Flitt H., Notoya T., Schweinsberg D.P. Corrosion Sci. 2003, 45:81.
-
(2003)
Corrosion Sci.
, vol.45
, pp. 81
-
-
Bartley, J.1
Huynh, N.2
Bottle, S.E.3
Flitt, H.4
Notoya, T.5
Schweinsberg, D.P.6
-
254
-
-
0036505034
-
-
Wang B., Zhou G.D., Zhang W.Y., Satake M., Notoya T., Schweinsberg D.P. J. Electrochem. Soc. 2002, 70:166.
-
(2002)
J. Electrochem. Soc.
, vol.70
, pp. 166
-
-
Wang, B.1
Zhou, G.D.2
Zhang, W.Y.3
Satake, M.4
Notoya, T.5
Schweinsberg, D.P.6
-
256
-
-
0034249557
-
-
Qafsaoui W., Blanc C., Pebere N., Srhiri A., Mankowski G. J. Appl. Electrochem. 2000, 30:959.
-
(2000)
J. Appl. Electrochem.
, vol.30
, pp. 959
-
-
Qafsaoui, W.1
Blanc, C.2
Pebere, N.3
Srhiri, A.4
Mankowski, G.5
-
263
-
-
0037591731
-
-
Wang C.T., Chen S.H., Ma H.Y., Qi C.S. J. Appl. Electrochem. 2003, 33:179.
-
(2003)
J. Appl. Electrochem.
, vol.33
, pp. 179
-
-
Wang, C.T.1
Chen, S.H.2
Ma, H.Y.3
Qi, C.S.4
-
264
-
-
84882739077
-
-
Quartarone G., Zingales A., Bellomi T., Bortolato D., Capobianco G. 9th European Symposium on Corrosion Inhibitors 2000, 2:673.
-
(2000)
9th European Symposium on Corrosion Inhibitors
, vol.2
, pp. 673
-
-
Quartarone, G.1
Zingales, A.2
Bellomi, T.3
Bortolato, D.4
Capobianco, G.5
-
267
-
-
0032215136
-
-
Cicileo G.P., Rosales B.M., Varela E.E., Vilche J.T. Corrosion Sci. 1998, 40:1915.
-
(1998)
Corrosion Sci.
, vol.40
, pp. 1915
-
-
Cicileo, G.P.1
Rosales, B.M.2
Varela, E.E.3
Vilche, J.T.4
-
272
-
-
0038715849
-
-
Tamilmani S., Huang W., Ragahvan S., Small R. Diffusion and Defect Data Part B 2003, 92:271.
-
(2003)
Diffusion and Defect Data Part B
, vol.92
, pp. 271
-
-
Tamilmani, S.1
Huang, W.2
Ragahvan, S.3
Small, R.4
-
273
-
-
0001127297
-
-
O'Brien E.C., Le Roy S., Levaillian J., Fitzgerald D.J., Nolan K.B. Inorg. Chim. Acta 1997, 266:117.
-
(1997)
Inorg. Chim. Acta
, vol.266
, pp. 117
-
-
O'Brien, E.C.1
Le Roy, S.2
Levaillian, J.3
Fitzgerald, D.J.4
Nolan, K.B.5
-
275
-
-
0032872597
-
-
Rosales B.M., Cicileo G.P., Varela E.E., Vilche J.R. Corrosion Sci. 1999, 41:1359.
-
(1999)
Corrosion Sci.
, vol.41
, pp. 1359
-
-
Rosales, B.M.1
Cicileo, G.P.2
Varela, E.E.3
Vilche, J.R.4
-
276
-
-
0012059295
-
-
Ma H., Chen S., Zhao S., Liu X., Li D. J. Electrochem. Soc. 2001, 148:B482.
-
(2001)
J. Electrochem. Soc.
, vol.148
, pp. B482
-
-
Ma, H.1
Chen, S.2
Zhao, S.3
Liu, X.4
Li, D.5
-
278
-
-
0037449966
-
-
Villami R.F.V., Cordeiro G.G.O., Matos J., D'Elia E., Agostinho S.M.L. Mat. Chem. Phys. 2002, 78:448.
-
(2002)
Mat. Chem. Phys.
, vol.78
, pp. 448
-
-
Villami, R.F.V.1
Cordeiro, G.G.O.2
Matos, J.3
D'Elia, E.4
Agostinho, S.M.L.5
-
279
-
-
0037401782
-
-
Ma H., Chen S., Yin B., Zhao S., Liu X. Corrosion Sci. 2003, 45:867.
-
(2003)
Corrosion Sci.
, vol.45
, pp. 867
-
-
Ma, H.1
Chen, S.2
Yin, B.3
Zhao, S.4
Liu, X.5
-
280
-
-
0035921011
-
-
Wang D., Xu Q.M., Wan L.J., Wang C., Bai C.L. Surf. Sci. 2001, 489:L568.
-
(2001)
Surf. Sci.
, vol.489
, pp. L568
-
-
Wang, D.1
Xu, Q.M.2
Wan, L.J.3
Wang, C.4
Bai, C.L.5
-
282
-
-
0036524089
-
-
Kilincceker G., Yazici B., Yilmaz A.B., Erbil M. Br. Corrosion J. 2002, 37:23.
-
(2002)
Br. Corrosion J.
, vol.37
, pp. 23
-
-
Kilincceker, G.1
Yazici, B.2
Yilmaz, A.B.3
Erbil, M.4
-
286
-
-
0035922874
-
-
Pascal M., Lamont C.L.A., Kittel M., Hoeft J.T., Terbog R., Polcik M., Kang J.H., Toomes R., Woodruff D.F. Surf. Sci. 2001, 492:285.
-
(2001)
Surf. Sci.
, vol.492
, pp. 285
-
-
Pascal, M.1
Lamont, C.L.A.2
Kittel, M.3
Hoeft, J.T.4
Terbog, R.5
Polcik, M.6
Kang, J.H.7
Toomes, R.8
Woodruff, D.F.9
-
294
-
-
84882740593
-
-
Branzoi V., Branzoi F., Pilan L., Baibarac M. EUROCORR (European Corrosion Congress) 1999, 227:28.
-
(1999)
EUROCORR (European Corrosion Congress)
, vol.227
, pp. 28
-
-
Branzoi, V.1
Branzoi, F.2
Pilan, L.3
Baibarac, M.4
-
295
-
-
0035738589
-
-
Park Y.B., Lee D.W., Ryu H.H., Lee W. J. Electron. Mater. 2001, 30:1569.
-
(2001)
J. Electron. Mater.
, vol.30
, pp. 1569
-
-
Park, Y.B.1
Lee, D.W.2
Ryu, H.H.3
Lee, W.4
-
298
-
-
84882748826
-
-
Kuwait Instit. of Sci. Research, Kuwait, H.M. Shalaby (Ed.)
-
Al-Kharafi F.M., Badawy W.A., El-Azab A.S. Industrial Corrosion and Corrosion Control Technology 1996, 417. Kuwait Instit. of Sci. Research, Kuwait. H.M. Shalaby (Ed.).
-
(1996)
Industrial Corrosion and Corrosion Control Technology
, pp. 417
-
-
Al-Kharafi, F.M.1
Badawy, W.A.2
El-Azab, A.S.3
-
302
-
-
0036121441
-
-
Lee H., Lin E.K., Wang H., Wu W., Chen W., Moyer E.S. Chem. Mater. 2002, 14:1845.
-
(2002)
Chem. Mater.
, vol.14
, pp. 1845
-
-
Lee, H.1
Lin, E.K.2
Wang, H.3
Wu, W.4
Chen, W.5
Moyer, E.S.6
-
304
-
-
79956042201
-
-
Lin E.K., Lee H.J., Wu W.L., O'Neill M.L. Appl. Phys. Lett. 2002, 81:607.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 607
-
-
Lin, E.K.1
Lee, H.J.2
Wu, W.L.3
O'Neill, M.L.4
-
305
-
-
18044401653
-
-
Lee H.J., Lin E.K., Wu W.L., Fanconi B.F., Lion H.C., Lan J.K., Cheng Y.L., Feng M.S., Wang Y.L., Chao C.G. J. Electrochem. Soc. 2001, 148:F195.
-
(2001)
J. Electrochem. Soc.
, vol.148
, pp. F195
-
-
Lee, H.J.1
Lin, E.K.2
Wu, W.L.3
Fanconi, B.F.4
Lion, H.C.5
Lan, J.K.6
Cheng, Y.L.7
Feng, M.S.8
Wang, Y.L.9
Chao, C.G.10
-
306
-
-
0001068614
-
-
Mansur H.S., Vasconcelos W.L., Lenza R.S., Orefice R.L., Reis E.F., Lobato Z.P. J. Non-Cryst. Solids 2000, 273:109.
-
(2000)
J. Non-Cryst. Solids
, vol.273
, pp. 109
-
-
Mansur, H.S.1
Vasconcelos, W.L.2
Lenza, R.S.3
Orefice, R.L.4
Reis, E.F.5
Lobato, Z.P.6
-
307
-
-
0001374950
-
-
Thim G.P., Oliviera M.A.S., Oliviera E.D.A., Melo F.C.L. J. NonCryst. Solids 2000, 273:124.
-
(2000)
J. NonCryst. Solids
, vol.273
, pp. 124
-
-
Thim, G.P.1
Oliviera, M.A.S.2
Oliviera, E.D.A.3
Melo, F.C.L.4
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