EC-STM study of 5-mercapto-1-phenyl-tetrazole adsorption on Cu(1 1 1)

Electrochimica Acta

Volumn 49, Issue 9-10, 2004, Pages 1371-1378

  Szocs, E ^a   Bako I ^a   Kosztolanyi T ^a   Bertoti I ^a   Kalman E ^a  

^a CHEMICAL RESEARCH CENTER   (Hungary)

Author keywords

5 Mercapto 1 phenyl tetrazole inhibitor; Copper; EC STM; Quantum chemical calculations; XPS

Indexed keywords

ADSORPTION; AROMATIC HYDROCARBONS; AUGER ELECTRON SPECTROSCOPY; COPPER; CORROSION INHIBITORS; MOLECULAR STRUCTURE; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SOLUTIONS; SULFURIC ACID; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

5-MERCAPTO-1-PHENYL-TETRAZOLE INHIBITORS; POTENTIODYNAMIC SCANNING TUNNELING MICROSCOPY (EC-STM); QUANTUM CHEMICAL CALCULATIONS;

ELECTROCHEMISTRY;

EID: 1042275376     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2003.10.035     Document Type: Article

References (44)

1. Mattson E., Bockris J.O.M. Trans. Faraday Soc. 40:1959;1586.
2. I.L. Rosenfield, Corrosion Inhibitors, McGraw-Hill, New York, 1981.
3. Young F.W. Jr., Cathcart J.V., Gwathmey A.T. Acta Metal. 4:1956;145.
4. Beier M., Schultze J.W. Electrochim. Acta. 37:1992;2299.
5. Trabanelli G. Corrosion. 133:1989;1.
6. Wu Y.C., Zhang P., Pieckering H.W., Allara D.L. J. Electrochem. Soc. 140:1993;2791.
7. Kuron D., Rother H.J., Holm R., Storp S. Werkstoffe Korrosion. 37:1986;83.
8. Tromans D., Silva J.C. Corrosion. 53:1997;171.
9. Zucchi F., Trabanelli G., Fonsati M. Corrosion Sci. 38:1996;2029.
10. Fonsati M., Zucchi F., Trabanelli G. Electrochim. Acta. 44:1998;311.
11. Essoufi H., Kertit S., Hammouti B., Benkaddour M. Bull. Electrochem. 16(5):2000;205.
12. Szocs E., Vastag Gy., Shaban A., Konczos G., Kálmán E. J. Appl. Electrochem. 29:1999;1339.
13. Ferral A., Paredes-Olivera P., Macagno V.A., Patrito E.M. Surf. Sci. 85:2003;525.
14. Maurice V., Strehblow H.-H., Marcus P. Surf. Sci. 458(1-3):2000;185.
15. Lennartz M., Broekmann P., Arenz M., Stuhlmann C., Wandelt K. Surf. Sci. 442(2):1999;215.
16. Wan L.-J., Itaya K. J. Electroanal. Chem. 473(1-2):1999;10.
17. Broekmann P., Wilms M., Kruft M., Stuhlmann C., Wandelt K. J. Electroanal. Chem. 467(1-2):1999;307.
18. Magnussen O.M., Zitzler L., Gleich B., Vogt M.R., Behm R.J. Electrochim. Acta. 46:2001;3725.
19. L. Zitzler, B. Gleich, O.M. Magnussen, R.J. Behm, in: A.C. Hillier, M. Seo, S.R. Taylor (Eds.), Localized In Situ Methods for Investigating Electrochemical Interfaces, Proc. Electrochem. Soc. 99 (28) (2000) 29-38.
20. Magnussen O.M., Vogt M.R., Scherer J., Behm R.J. Appl. Phys. A. 66:1998;S447-S452.
21. Vogt M.R., Lachenwitzer A., Magnussen O.M., Behm R.J. Surf. Sci. 399:1998;49-80.
22. Wilms M., Broekmann P., Kruft M., Park Z., Stuhlmann C., Wandelt K. Surf. Sci. 402-404:1998;83.
23. Broekmann P., Wilms M., Spaenig A., Wandelt K. Prog. Surf. Sci. 67:2001;59.
24. Vogt M.R., Nichols R.J., Magnussen O.M., Behm R.J. J. Phys. Chem. B. 102:1998;5859.
25. Polewska W., Vogt M.R., Magnussen O.M., Behm R.J. J. Phys. Chem. B. 103:1999;10440.
26. Vogt M.R., Möller F.A., Schilz C.M., Magnussen O.M., Behm R.J. Surf. Sci. 367:1997;L33.
27. Wilms M., Broekmann P., Stuhlmann C., Wandelt K. Appl. Phys. A. 66:1998;473.
28. Wilms M., Broekmann P., Stuhlmann C., Wandelt K. Surf. Sci. 416:1998;121.
29. Lennartz M., Broekmann P., Arenz M., Stuhlmann C., Wandelt K. Surf. Sci. 442:1999;215.
30. Broekmann P., Wilms M., Wandelt K. Surf. Rev. Lett. 65:1999;907.
31. Li W.-H., Nichols R. J. Electroanal. Chem. 456:1998;153.
32. Sugimasa M., Wan L.-J., Inukai J., Itaya K. J. Electrochem. Soc. 149(10):2002;E367.
33. Yin X.-L., Wan L.-J., Yang Z.-Y., Yu J.-Y., Bai C.-L. Surf. Sci. 531(3):2003;226.
34. Wang D., Xu Q.-M., Wan L.-J., Wang C., Bai C.-L. Langmuir. 18(13):2002;5133.
35. Magnussen O.M., Behm R.J. Mater. Res. Bull. 24:1999;16-23.
36. Vogt M.R., Polewska W., Magnussen O.M., Behm R.J. J. Electrochem. Soc. Lett. 144:1997;L113.
37. E. Szocs, Gy. Vastag, A. Shaban, E. Kálmán, Corrosion Sci., 2002, in press.
38. Schmidt U., Dietsche M. Angew. Chem. Int. Ed. Engl. 20:1981;771.
39. Kazinczi R., Szocs E., Kálmán E., Nagy P. Appl. Phys. A. 66:1998;535.
40. M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, M.A. Robb, J.R. Cheeseman, V.G. Zakrzewski, J.A. Montgomery, R.E. Stratmann, J.C. Burant, S. Dapprich, J.M. Millam, A.D. Daniels, K.N. Kudin, M.C. Strain, O. Farkas, J. Tomasi, V. Barone, M. Cossi, R. Cammi, B. Mennucci, C. Pomelli, C. Adamo, S. Clifford, J. Ochterski, G.A. Petersson, P.Y. Ayala, Q. Cui, K. Morokuma, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J. Cioslowski, J.V. Ortiz, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R. Gomperts, R.L. Martin, D.J. Fox, T. Keith, M.A. Al-Laham, C.Y. Peng, A. Nanayakkara, C. Gonzalez, M. Challacombe, P.M.W. Gill, B.G. Johnson, W. Chen, M.W. Wong, J.L. Andres, M. Head-Gordon, E.S. Replogle, J.A. Pople, Gaussian 98, Gaussian Inc., Pittsburgh, PA, 1998 (revision A.7).
41. P. Flükiger, H.P. Lühti, S. Portmann, J. Weber, Molekel 4.1, Swiss Center for Scientific Computing, Manno, Switzerland, 2000-2001.
42. Tersoff J., Hamann D.R. Phys. Rev. B. 805:1985;31.
43. Davis J.J., Hill H.A.O., Yamada R., Naohara H., Uosaki K. J. Chem. Soc., Faraday Trans. 14:1998;1315.
44. Contini G., DiCastro V., Angelaccio A., Motta N., Sgarlara A. Surf. Sci. 407:2000;7.