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Volumn 78, Issue 12, 2006, Pages 4069-4096

X-ray spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON PROBE MICROANALYSIS; HOLOGRAPHY; INSTRUMENTATION; OPTICS; QUANTITATIVE ANALYSIS; RADIATION SCATTERING; REVIEW; SAMPLING; STANDARD; TOMOGRAPHY; TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS; X RAY SPECTROMETRY;

EID: 33745304372     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac060688j     Document Type: Review
Times cited : (14)

References (209)
  • 200
    • 15944395123 scopus 로고    scopus 로고
    • Ueda, Y.; Mitsuda, K.; Murakami, H.; Matsushita, K. 2005, 620, 274-286
    • Ueda, Y.; Mitsuda, K.; Murakami, H.; Matsushita, K. 2005, 620, 274-286.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.