Particle induced X-ray emission - Relative yield ion energy dependence, an IBA chemical speciation method

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 229, Issue 3-4, 2005, Pages 413-424

  Reis, M A ^a   Chaves, P C ^a   Soares, J C ^b  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b CENTRO DE FÍSICA NUCLEAR DA UNIVERSIDADE DE LISBOA   (Portugal)

Author keywords

Chemical speciation; Intensity ratio variation patterns; Ion energy scan; Line intensity variometry; PIXE

Indexed keywords

COMPUTER SIMULATION; ION BEAMS; LITHIUM COMPOUNDS; MATHEMATICAL MODELS; PARTICLE DETECTORS; PROTON IRRADIATION; PROTONS; VECTORS;

CHEMICAL SPECIATION; INTENSITY RATIO VARIATION PATTERNS; ION ENERGY SCAN; LINE INTENSITY VARIOMETRY; PIXE;

X RAYS;

EID: 14544281041     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.113     Document Type: Article

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