Censoring: A new approach for detection limits in total-reflection x-ray fluorescence

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 8, 2004, Pages 1091-1099

  Pajek, M ^a   Kubala Kukus A ^a   Braziewicz, J ^a  

^a JAN KOCHANOWSKI UNIVERSITY   (Poland)

Author keywords

Detection limits; Kaplan Meier estimator; Random left censoring; Total reflection X ray fluorescence (TXRF); Trace elements

Indexed keywords

DATA REDUCTION; FLUORESCENCE; MONTE CARLO METHODS; STATISTICAL METHODS; TRACE ELEMENTS; VLSI CIRCUITS;

DETECTION LIMITS; KAPLAN-MEIER ESTIMATOR; RANDOM LEFT-CENSORING; TOTAL-REFLECTION X-RAY FLUORESCENCE (TXRF);

X RAYS;

EID: 4644360370     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.05.021     Document Type: Conference Paper

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