Empirical coefficients models for x-ray fluorescence analysis of intermediate-thickness samples

X-Ray Spectrometry

Volumn 34, Issue 1, 2005, Pages 11-18

  Sitko, Rafał ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

COEFFICIENT MODELS; EMPIRICAL COEFFICIENTS; MATRICES EFFECT; MEMBRANE FILTERS; MULTIELEMENTS; PER UNIT; REFERENCE MATERIAL; SCATTERED RADIATIONS; X RAY FLUORESCENCE ANALYSIS;

FLUORESCENCE;

EID: 13244251176     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.778     Document Type: Article

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