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Volumn 33, Issue 2, 2004, Pages 112-116
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Elemental analysis by high-energy electron excitation
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
CHEMICAL ELEMENTS;
DATA ACQUISITION;
ELECTRON BEAMS;
ELECTRONS;
SPECTROMETRY;
CALIBRATION CURVES;
CHARACTERISTIC X RAYS;
ELECTRON EXCITATIONS;
ELECTRON PROBE MICROANALYSES;
ELECTRON-BEAM;
ELECTRON-PROBE MICROANALYSIS;
ENERGY;
HIGH-ENERGY ELECTRON;
PURE CHEMICALS;
SPECTROMETRIC TECHNIQUES;
ELECTRON PROBE MICROANALYSIS;
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EID: 1642317164
PISSN: 00498246
EISSN: None
Source Type: Journal
DOI: 10.1002/xrs.716 Document Type: Article |
Times cited : (3)
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References (11)
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