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Volumn 33, Issue 2, 2004, Pages 112-116

Elemental analysis by high-energy electron excitation

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CHEMICAL ELEMENTS; DATA ACQUISITION; ELECTRON BEAMS; ELECTRONS; SPECTROMETRY;

EID: 1642317164     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.716     Document Type: Article
Times cited : (3)

References (11)
  • 5
    • 2742556682 scopus 로고
    • Khare SP, Saksena V, Wadehra JM. Phys. Rev. A 1993; 48: 1209; Khare SP, Wadehra JM. Phys. Lett. A 1995; 198: 212.
    • (1995) Phys. Lett. A , vol.198 , pp. 212
    • Khare, S.P.1    Wadehra, J.M.2
  • 6
    • 85159508426 scopus 로고
    • PhD Thesis, University of Paris
    • Castaing R. PhD Thesis, University of Paris, 1951.
    • (1951)
    • Castaing, R.1
  • 9
    • 85159510989 scopus 로고
    • Kevex Corporation: Burlingame, CA
    • Woldseth R, X-Ray Spectrometry Kevex Corporation: Burlingame, CA, 1973; 3.8.
    • (1973) X-ray Spectrometry
    • Woldseth, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.