Self-element secondary fluorescence enhancement in XRF analysis

X-Ray Spectrometry

Volumn 34, Issue 5, 2005, Pages 426-431

  Karydas, A G ^a  

^a INSTITUTE OF NUCLEAR PHYSICS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTRUM ANALYSIS;

CHARACTERISTIC X RAYS; ENERGY DISPERSIVE; FLUORESCENCE ENHANCEMENT; FLUORESCENCE INTENSITIES; HOMOGENEOUS SAMPLES; INTENSITY RATIO; NON-HOMOGENEOUS; SECONDARY FLUORESCENCE; SPECTRA FEATURES; XRF ANALYSIS;

FLUORESCENCE;

EID: 25444527221     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.848     Document Type: Conference Paper

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