X-ray microanalysis of a coated nonconductive specimen: Monte Carlo simulation

Microscopy and Microanalysis

Volumn 10, Issue 6, 2004, Pages 776-782

  Demers, Hendrix ^a   Gauvin, Raynald ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

Charging; Coated specimen; Monte Carlo calculations; Nonconductive specimen; Scanning electron microscopy; X ray microanalysis; X ray spectrum simulation

Indexed keywords

ALUMINUM OXIDE;

CONFERENCE PAPER; ELECTRON PROBE MICROANALYSIS; MONTE CARLO METHOD; STATIC ELECTRICITY;

ALUMINUM OXIDE; ELECTRON PROBE MICROANALYSIS; MONTE CARLO METHOD; STATIC ELECTRICITY;

EID: 11244277028     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040607     Document Type: Conference Paper

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