메뉴 건너뛰기




Volumn 59, Issue 8, 2004, Pages 1141-1147

A simple and precise total reflection X-ray fluorescence spectrometer: Construction and its applications

Author keywords

Grazing incidence X ray fluorescence; Instrumentation; Total reflection X ray fluorescence; X ray fluorescence

Indexed keywords

FLUORESCENCE; MATHEMATICAL MODELS; MONOCHROMATORS; SPECTROMETERS; SPECTROSCOPIC ANALYSIS; TRACE ELEMENTS;

EID: 4644325841     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.03.010     Document Type: Conference Paper
Times cited : (22)

References (28)
  • 1
    • 0042719482 scopus 로고    scopus 로고
    • Elemental analysis of environmental samples by total reflection X-ray fluorescence: A review
    • Klockenkamper R., Von Bohlen A. Elemental analysis of environmental samples by total reflection X-ray fluorescence: a review. X-ray Spectrom. 25:1996;156-162.
    • (1996) X-ray Spectrom. , vol.25 , pp. 156-162
    • Klockenkamper, R.1    Von Bohlen, A.2
  • 2
    • 0027685065 scopus 로고
    • A new spectrometer for total reflection X-ray fluorescence analysis of light elements
    • Streli C., Wobrauschek P., Unfried E., Aiginger H. A new spectrometer for total reflection X-ray fluorescence analysis of light elements. Nucl. Instr. Methods A. 334:1993;425-429.
    • (1993) Nucl. Instr. Methods A , vol.334 , pp. 425-429
    • Streli, C.1    Wobrauschek, P.2    Unfried, E.3    Aiginger, H.4
  • 3
    • 0022386350 scopus 로고
    • Determination of trace elements in rainwater by total-reflection X-ray fluorescence
    • Stossel R.P., Prange A. Determination of trace elements in rainwater by total-reflection X-ray fluorescence. Anal. Chem. 57:1985;2880-2885.
    • (1985) Anal. Chem. , vol.57 , pp. 2880-2885
    • Stossel, R.P.1    Prange, A.2
  • 5
    • 0037107361 scopus 로고    scopus 로고
    • Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin layer analysis
    • Klockenkamper R., Becker H.W., Bubert H., von Bohlen A. Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin layer analysis. Spectrochim. Acta Part B. 57:2002;1593-1599.
    • (2002) Spectrochim. Acta Part B , vol.57 , pp. 1593-1599
    • Klockenkamper, R.1    Becker, H.W.2    Bubert, H.3    Von Bohlen, A.4
  • 6
    • 0034262483 scopus 로고    scopus 로고
    • Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces
    • Pianetta P., Baur K., Singh A., Brennan S., Kerner J., Werho D., Wang J. Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces. Thin Solid Films. 373:2000;222-226.
    • (2000) Thin Solid Films , vol.373 , pp. 222-226
    • Pianetta, P.1    Baur, K.2    Singh, A.3    Brennan, S.4    Kerner, J.5    Werho, D.6    Wang, J.7
  • 7
    • 0026258448 scopus 로고
    • Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis
    • Weisbrod U., Gutschke R., Knoth J., Schwenke H. Total reflection X-ray fluorescence spectrometry for quantitative surface and layer analysis. Appl. Phys. A. 53:1991;449-456.
    • (1991) Appl. Phys. A , vol.53 , pp. 449-456
    • Weisbrod, U.1    Gutschke, R.2    Knoth, J.3    Schwenke, H.4
  • 8
    • 13444285568 scopus 로고
    • Glancing-incidence X-ray fluorescence of layered materials
    • de Boer D.K.G. Glancing-incidence X-ray fluorescence of layered materials. Phys. Rev. B. 44:1991;498-511.
    • (1991) Phys. Rev. B , vol.44 , pp. 498-511
    • De Boer, D.K.G.1
  • 10
    • 0035976278 scopus 로고    scopus 로고
    • Laboratory and synchrotron radiation total-reflection X-ray fluorescence: New perspectives in detection limits and data analysis
    • Baur K., Brennan S., Burrow B., Werho D., Pianetta P. Laboratory and synchrotron radiation total-reflection X-ray fluorescence: new perspectives in detection limits and data analysis. Spectrochim. Acta Part B. 56:2001;2049-2056.
    • (2001) Spectrochim. Acta Part B , vol.56 , pp. 2049-2056
    • Baur, K.1    Brennan, S.2    Burrow, B.3    Werho, D.4    Pianetta, P.5
  • 11
    • 36849102332 scopus 로고
    • Optical flats for use in X-ray spectrochemical microanalysis
    • Yoneda Y., Horiuchi T. Optical flats for use in X-ray spectrochemical microanalysis. Rev. Sci. Instrum. 42:1971;1069-1070.
    • (1971) Rev. Sci. Instrum. , vol.42 , pp. 1069-1070
    • Yoneda, Y.1    Horiuchi, T.2
  • 12
    • 0015952814 scopus 로고
    • A method for quantitative X-ray fluorescence analysis in the nanogram region
    • Aiginger H., Wobrauschek P. A method for quantitative X-ray fluorescence analysis in the nanogram region. Nucl. Instr. Methods. 114:1974;157-158.
    • (1974) Nucl. Instr. Methods , vol.114 , pp. 157-158
    • Aiginger, H.1    Wobrauschek, P.2
  • 14
    • 0001552652 scopus 로고
    • Total-reflection X-ray fluorescence spectrometric determination of elements in nanogram amount
    • Wobrauschek P., Aiginger H. Total-reflection X-ray fluorescence spectrometric determination of elements in nanogram amount. Anal. Chem. 47:1975;852-855.
    • (1975) Anal. Chem. , vol.47 , pp. 852-855
    • Wobrauschek, P.1    Aiginger, H.2
  • 15
    • 34250284959 scopus 로고
    • An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level
    • Knoth J., Schwenke H. An X-ray fluorescence spectrometer with totally reflecting sample support for trace analysis at the ppb level. Fresenius Z. Anal. Chem. 291:1978;200-204.
    • (1978) Fresenius Z. Anal. Chem. , vol.291 , pp. 200-204
    • Knoth, J.1    Schwenke, H.2
  • 16
    • 0005026198 scopus 로고
    • Analytical application of total reflection and polarized X-rays
    • Wobrauschek P., Aiginger H. Analytical application of total reflection and polarized X-rays. Fresenius Z. Anal. Chem. 324:1986;865-874.
    • (1986) Fresenius Z. Anal. Chem. , vol.324 , pp. 865-874
    • Wobrauschek, P.1    Aiginger, H.2
  • 18
    • 0024777225 scopus 로고
    • Total reflection X-ray fluorescence analysis with polarized X-rays, a compact attachment unit, and high energy X-rays
    • Wobrauschek P., Kregsamer P. Total reflection X-ray fluorescence analysis with polarized X-rays, a compact attachment unit, and high energy X-rays. Spectrochim. Acta Part B. 44:1989;453-460.
    • (1989) Spectrochim. Acta Part B , vol.44 , pp. 453-460
    • Wobrauschek, P.1    Kregsamer, P.2
  • 19
    • 0002713564 scopus 로고
    • Instrumental developments in total reflection X-ray fluorescence analysis for K-lines from oxygen to the rare earth elements
    • Wobrauschek P., Kregsamer P., Streli C., Aiginger H. Instrumental developments in total reflection X-ray fluorescence analysis for K-lines from oxygen to the rare earth elements. X-ray Spectrom. 20:1991;23-28.
    • (1991) X-ray Spectrom. , vol.20 , pp. 23-28
    • Wobrauschek, P.1    Kregsamer, P.2    Streli, C.3    Aiginger, H.4
  • 20
    • 0027577708 scopus 로고
    • A multifunctional vacuum chamber for total reflection X-ray fluorescence analysis in various excitation and detection geometries for detection limits in the femtogram range
    • Rieder R., Ladisich W., Wobrauschek P., Streli C., Kregsamer P. A multifunctional vacuum chamber for total reflection X-ray fluorescence analysis in various excitation and detection geometries for detection limits in the femtogram range. Nucl. Instr. Methods A. 327:1993;594-599.
    • (1993) Nucl. Instr. Methods A , vol.327 , pp. 594-599
    • Rieder, R.1    Ladisich, W.2    Wobrauschek, P.3    Streli, C.4    Kregsamer, P.5
  • 21
    • 0030109013 scopus 로고    scopus 로고
    • A total reflection X-ray fluorescence spectrometer using a rotating anode
    • Pettersson R.P., Boman J. A total reflection X-ray fluorescence spectrometer using a rotating anode. Nucl. Instr. Methods A. 371:1996;553-559.
    • (1996) Nucl. Instr. Methods A , vol.371 , pp. 553-559
    • Pettersson, R.P.1    Boman, J.2
  • 22
    • 0005013454 scopus 로고    scopus 로고
    • The analytical possibilities of a portable TXRF-spectrometer
    • Waldschlager U. The analytical possibilities of a portable TXRF-spectrometer. Adv. X-ray Anal. 43:2000;418-423.
    • (2000) Adv. X-ray Anal. , vol.43 , pp. 418-423
    • Waldschlager, U.1
  • 23
    • 0036773502 scopus 로고    scopus 로고
    • Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis
    • Tiwari M.K., Gowrishankar B., Raghuvanshi V.K., Nandedkar R.V., Sawhney K.J.S. Development of a total reflection X-ray fluorescence spectrometer for ultra-trace element analysis. Bull. Mater. Sci. 25(5):2002;435-441.
    • (2002) Bull. Mater. Sci. , vol.25 , Issue.5 , pp. 435-441
    • Tiwari, M.K.1    Gowrishankar, B.2    Raghuvanshi, V.K.3    Nandedkar, R.V.4    Sawhney, K.J.S.5
  • 24
    • 0035311518 scopus 로고    scopus 로고
    • The diffusion mechanism of tin into glass governed by redox reactions during the float process
    • Hayashi Y., Matsumoto K., Kudo M. The diffusion mechanism of tin into glass governed by redox reactions during the float process. J. Non-Cryst. Solids. 282:2001;188-196.
    • (2001) J. Non-cryst. Solids , vol.282 , pp. 188-196
    • Hayashi, Y.1    Matsumoto, K.2    Kudo, M.3
  • 26
    • 0345548543 scopus 로고    scopus 로고
    • Effect of tin diffusion on the optical behavior of float glass in the soft X-ray region
    • Modi M.H., Lodha G.S., Sawhney K.J.S., Nandedkar R.V. Effect of tin diffusion on the optical behavior of float glass in the soft X-ray region. Appl. Opt. 42(34):2003;6939-6944.
    • (2003) Appl. Opt. , vol.42 , Issue.34 , pp. 6939-6944
    • Modi, M.H.1    Lodha, G.S.2    Sawhney, K.J.S.3    Nandedkar, R.V.4
  • 27
    • 0034498691 scopus 로고    scopus 로고
    • Multilayer X-ray optics for energies E>8 keV and their application in X-ray analysis
    • Dietsch R., Braun S., Holz T., Mai H., Scholz R., Bruegemann L. Multilayer X-ray optics for energies E>8 keV and their application in X-ray analysis. Proc. SPIE. 4144:2000;137-147.
    • (2000) Proc. SPIE , vol.4144 , pp. 137-147
    • Dietsch, R.1    Braun, S.2    Holz, T.3    Mai, H.4    Scholz, R.5    Bruegemann, L.6
  • 28
    • 0344466342 scopus 로고    scopus 로고
    • Applicability of a cut-off reflector for grazing incidence X-ray fluorescence analysis
    • Tiwari M.K., Sawhney K.J.S. Applicability of a cut-off Reflector for grazing incidence X-ray fluorescence analysis. Spectrochim. Acta Part B. 58:2003;1895-1900.
    • (2003) Spectrochim. Acta Part B , vol.58 , pp. 1895-1900
    • Tiwari, M.K.1    Sawhney, K.J.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.