Monte Carlo study of quantitative EPMA analysis of a non-conducting sample with a coating film

X-Ray Spectrometry

Volumn 34, Issue 2, 2005, Pages 96-100

  Osada, Yoshio ^a  

^a Nikkei Analytical Center Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM NITRIDE; ALUMINUM OXIDE; CHEMICAL ELEMENTS; DISSOCIATION; ELECTROLYTES; ELECTRON ENERGY LEVELS; ELECTRON PROBE MICROANALYSIS; GOLD COATINGS; III-V SEMICONDUCTORS; INTELLIGENT SYSTEMS;

CALCULATION MODELS; COATING FILMS; ELECTRON PROBE MICROANALYSES; ELECTRON-PROBE MICROANALYSIS; ELECTRONS ENERGY; ENERGY ATTENUATION; MONTE CARLO'S SIMULATION; PRIMARY ELECTRONS; X RAY INTENSITY; X-RAY ATTENUATION;

MONTE CARLO METHODS;

EID: 14544292517     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.798     Document Type: Article

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