The BESSY X-ray microfocus beamline project

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 10-11, 2004, Pages 1543-1548

  Erko, A ^a   Schafers F ^a   Firsov, A ^a   Peatman, W B ^a   Eberhardt, W ^a   Signorato, R ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b ACCEL Instruments GmbH   (Germany)

Author keywords

Synchrotron radiation instrumentation; X ray absorption near edge structure spectroscopy; X ray fluorescence analysis; X ray microanalysis

Indexed keywords

ABSORPTION SPECTROSCOPY; CAPILLARITY; FLUORESCENCE; LENSES; MIRRORS; SYNCHROTRON RADIATION; X RAY DIFFRACTION; X RAY SCATTERING;

SYNCHROTRON RADIATION INSTRUMENTATION; X-RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X-RAY FLUORESCENCE ANALYSIS; X-RAY MICROANALYSIS;

X RAY SPECTROSCOPY;

EID: 5544290606     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.03.015     Document Type: Conference Paper

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