Ultratrace speciation of nitrogen compounds in aerosols collected on silicon wafer surfaces by means of TXRF-NEXAFS

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Volumn 19, Issue 1, 2004, Pages 81-86

  Torok S ^a   Osan J ^a   Beckhoff, B ^b   Ulm, G ^b  

^a KFKI ATOMIC ENERGY RESEARCH INSTITUTE   (Hungary)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITATION ENERGIES; SPECIATION;

ATMOSPHERIC AEROSOLS; DETECTORS; MONOCHROMATORS; RADIOMETRY; REMOTE SENSING; SILICON WAFERS; SYNCHROTRON RADIATION; TURBIDITY; X RAY ANALYSIS;

NITROGEN COMPOUNDS;

EID: 12144287079     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1649327     Document Type: Article

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