SCOPUS 정보 검색 플랫폼

Microchimica Acta

Volumn 145, Issue 1-4, 2004, Pages 81-85

Microcalorimeter detectors and low voltage SEM microanalysis

(3) Kenik, Edward A a Joy, David C a,b Redfern, Del c

a OAK RIDGE NATIONAL LABORATORY (United States)

b UNIVERSITY OF TENNESSEE (United States)

c EDAX Mahwah (United States)

Author keywords

Energy dispersive X ray spectrometry; Low voltage X ray microanalysis; Microcalorimeter; Scanning electron microscopy

Indexed keywords

ALUMINUM; COPPER; METAL; MOLYBDENUM; SILICON; SILVER; TUNGSTEN;

CONFERENCE PAPER; ELECTRIC POTENTIAL; ELECTRON BEAM; MICROCALORIMETRY; OPTICS; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTOR; TEMPERATURE; X RAY MICROANALYSIS; X RAY SPECTROMETRY;

EID: 2942662322 PISSN: 00263672 EISSN: None Source Type: Journal
DOI: 10.1007/s00604-003-0131-0 Document Type: Conference Paper

Times cited : (15)

References (10)

1
- 2942665366
- Etz E S (ed) VCH Publishers, NY
- Martinis J (1995) Low temperature X-ray detectors with 10-20 eV resolution and high count rates, microbeam analysis. In: Etz E S (ed) VCH Publishers, NY, p 3
- (1995) Low Temperature X-ray Detectors with 10-20 eV Resolution and High Count Rates, Microbeam Analysis , pp. 3
- Martinis, J.¹

2
- 2942630507
- Etz E S (ed) VCH Publishers, NY
- Silver E, Legros M, Madden N, Beeman J (1995) X-ray microanalysis using a high resolution, broad beam microcalorimeter, microbeam analysis. In: Etz E S (ed) VCH Publishers, NY, p 5
- (1995) X-ray Microanalysis Using a High Resolution, Broad Beam Microcalorimeter, Microbeam Analysis , pp. 5
- Silver, E.¹ Legros, M.² Madden, N.³ Beeman, J.⁴

3
- 0033732930
- Wollman D A, Nam S W, Newbury D E, Hilton G C, Irwin K D, Bergren N F, Deiker S, Rudman D A, Martinis J M (2000) Nucl Instr Meth 138A: 145-150
- (2000) Nucl Instr Meth , vol.138 A , pp. 145-150
- Wollman, D.A.¹ Nam, S.W.² Newbury, D.E.³ Hilton, G.C.⁴ Irwin, K.D.⁵ Bergren, N.F.⁶ Deiker, S.⁷ Rudman, D.A.⁸ Martinis, J.M.⁹

4
- 0036317719
- Newbury D, Wollman D, Nam S W, Hilton G, Irwin K, Small J, Martinis J (2002) Microchim Acta 138: 265-270
- (2002) Microchim Acta , vol.138 , pp. 265-270
- Newbury, D.¹ Wollman, D.² Nam, S.W.³ Hilton, G.⁴ Irwin, K.⁵ Small, J.⁶ Martinis, J.⁷

5
- 2942693472
- Microcalorimeter EDS detectors and their application in low voltage SEM-based microanalysis
- accepted
- Kenik E A, Joy D C, Redfern D (2003) Microcalorimeter EDS detectors and their application in low voltage SEM-based microanalysis. Proc EMAS (accepted)
- (2003) Proc EMAS
- Kenik, E.A.¹ Joy, D.C.² Redfern, D.³

6
- 0033005629
- Newbury D, Wollman D, Irwin K, Hilton G, Martinis J (1999) Ultramicroscopy 78: 73-88
- (1999) Ultramicroscopy , vol.78 , pp. 73-88
- Newbury, D.¹ Wollman, D.² Irwin, K.³ Hilton, G.⁴ Martinis, J.⁵

7
- 0033922353
- Wollman D A, Nam S W, Hilton G C, Irwin K D, Bergren N F, Rudman D A, Martinis J M, Newbury D E (1999) J Microscopy 199: 37-44
- (1999) J Microscopy , vol.199 , pp. 37-44
- Wollman, D.A.¹ Nam, S.W.² Hilton, G.C.³ Irwin, K.D.⁴ Bergren, N.F.⁵ Rudman, D.A.⁶ Martinis, J.M.⁷ Newbury, D.E.⁸

8
- 0036413670
- Small J A, Newbury D E, Scott J H J, King L, Nam S W, Irwin K, Deiker S, Barkan S, Iwanczyk J (2002) Microsc Microanal 8[Suppl] 2: 82-83
- (2002) Microsc Microanal , vol.8 , Issue.SUPPL. 2 , pp. 82-83
- Small, J.A.¹ Newbury, D.E.² Scott, J.H.J.³ King, L.⁴ Nam, S.W.⁵ Irwin, K.⁶ Deiker, S.⁷ Barkan, S.⁸ Iwanczyk, J.⁹

9
- 2942674179
- Private communication. Irwin K D (ed) NIST Boulder, CO
- Private communication (2003) In: Irwin K D (ed) NIST Boulder, CO
- (2003)

10
- 0032620886
- Chervenak J A, Irwin K D, Grossman E, Martinis J M, Reintsema C D, Huber M (1999) Appl Phys Lett 74: 4043-4045
- (1999) Appl Phys Lett , vol.74 , pp. 4043-4045
- Chervenak, J.A.¹ Irwin, K.D.² Grossman, E.³ Martinis, J.M.⁴ Reintsema, C.D.⁵ Huber, M.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.