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Volumn 34, Issue 2, 2005, Pages 124-127

Determination of L-shell intensity ratios for Yb, Hf and Ta by a parameter refinement method

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PARAMETER; EXPERIMENTAL PARAMETERS; INTENSITY RATIO; L SHELL; PARAMETER REFINEMENT; RADIATIVE DECAY; REFINEMENT METHODS; SPECTRA'S; TRANSITION RATES; X RAY FLUORESCENCE;

EID: 14544302734     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.772     Document Type: Article
Times cited : (6)

References (12)
  • 10
    • 0004326059 scopus 로고
    • International Union of Crystallography, Oxford University Press: Oxford
    • Young R. The Rietveld Method. International Union of Crystallography, Oxford University Press: Oxford, 1993.
    • (1993) The Rietveld Method
    • Young, R.1
  • 12
    • 0001907758 scopus 로고
    • Brown J, Packwood R (eds). University of Western Ontario: Ontario
    • Heinrich K. In X-Ray Optics and Microanalysis, Brown J, Packwood R (eds). University of Western Ontario: Ontario, 1987; 67.
    • (1987) X-ray Optics and Microanalysis , pp. 67
    • Heinrich, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.