Nanometer focusing of X-rays with modified reflection zone plates

Optics Communications

Volumn 245, Issue 1-6, 2005, Pages 249-253

  Michette, A G ^a   Pfauntsch, S J ^a   Erko, A ^b   Firsov, A ^b   Svintsov, A ^c  

^a KING'S COLLEGE LONDON   (United Kingdom)

^b HAHN MEITNER INSTITUT   (Germany)

^c INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

Nanometer focusing; Zone plates

Indexed keywords

NANOMETER FOCUSING; OPTICAL MODE FORMATION; SPATIAL RESOLUTION; ZONE PLATES;

ELECTROMAGNETIC WAVE DIFFRACTION; FREE ELECTRON LASERS; LIGHT REFLECTION; LIGHT REFRACTION; LIGHT TRANSMISSION; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; SYNCHROTRON RADIATION; X RAY SPECTROSCOPY; X RAYS;

OPTICAL WAVEGUIDES;

EID: 11444258454     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.09.073     Document Type: Article

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