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Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 10-11, 2004, Pages 1717-1723

Application of combined micro-proton-induced X-ray emission and micro-synchrotron radiation X-ray fluorescence techniques for the characterization of impact materials around Barringer Meteor Crater

(9) Uzonyi, I a Szoor Gy b Vekemans, B c Vincze, L c Rozsa P b Szabo Gy a Somogyi, A d Adams, F c Kiss, A Z a

a INSTITUTE OF EXPERIMENTAL MEDICINE (Hungary)

b UNIVERSITY OF DEBRECEN (Hungary)

c UNIVERSITY OF ANTWERP (Belgium)

d EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

Author keywords

Barringer Meteor Crater; Impact materials; Micro PIXE; Micro SRXRF

Indexed keywords

CONCENTRATION (PROCESS); FLUORESCENCE; GAMMA RAYS; IRON; NICKEL; PROTONS; SCANNING ELECTRON MICROSCOPY; SILICON;

BARRINGER METEOR CRATER; EJECTA LAYER; IMPACT MATERIALS; METALLIC OBJECTS;

SYNCHROTRON RADIATION;

EID: 5544249208 PISSN: 05848547 EISSN: None Source Type: Journal
DOI: 10.1016/j.sab.2004.05.030 Document Type: Conference Paper

Times cited : (7)

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