An annular Si drift detector μPIXE system using AXSIA analysis

X-Ray Spectrometry

Volumn 34, Issue 4, 2005, Pages 279-284

  Doyle, B L ^a   Walsh, D S ^a   Kotula, P G ^a   Rossi, P ^a,c   Schulein T ^b   Rohde, M ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b RÖNTEC GmbH   (Germany)

^c UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COUNT RATES; ENERGY RESOLUTIONS; IMAGE-ANALYSIS; MICRO BEAMS; PELTIER; SI-DRIFT DETECTORS; SILICON DRIFT DETECTOR; SOLID ANGLE; SPECTRAL IMAGES; WORKING DISTANCES;

EID: 22544434937     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.840     Document Type: Conference Paper

References (12)

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12. http://www.sandia.gov/materials/sciences/factsheets/SpecImag.html