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Volumn 545, Issue 1-2, 2005, Pages 459-468

Apparatus for X-ray diffraction microscopy and tomography of cryo specimens

Author keywords

Diffraction microscopy; Lensless imaging; X ray imaging; X ray microscopy; X ray tomography

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; CRYOGENICS; HYDRATION; IMAGING TECHNIQUES; LENSES; TOMOGRAPHY; X RAY DIFFRACTION ANALYSIS;

EID: 21044440262     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2004.12.040     Document Type: Article
Times cited : (28)

References (22)
  • 3
    • 0002392403 scopus 로고
    • Prospects for long-wavelength X-ray microscopy and diffraction
    • M. Schlenker, M. Fink, J. Goedgebuer, C. Malgrange, J. Viénot, R. Wade (Eds.), Imaging Processes and Coherence in Physics Springer, Berlin
    • D. Sayre, Prospects for long-wavelength X-ray microscopy and diffraction, in: M. Schlenker, M. Fink, J. Goedgebuer, C. Malgrange, J. Viénot, R. Wade (Eds.), Imaging Processes and Coherence in Physics, Lecture Notes in Physics, vol. 112, Springer, Berlin, 1980, pp. 229-235.
    • (1980) Lecture Notes in Physics , vol.112 , pp. 229-235
    • Sayre, D.1
  • 8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.