Examining nanoparticle assemblies using high spatial resolution x-ray microtomography

Journal of Applied Physics

Volumn 96, Issue 5, 2004, Pages 2889-2894

  Jenneson, P M ^a   Luggar, R D ^a   Morton, E J ^a   Gundogdu, O ^a   Tuzun U ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL FLUID DYNAMICS; COMPUTER SIMULATION; COMPUTERIZED TOMOGRAPHY; DETECTOR CIRCUITS; NANOSTRUCTURED MATERIALS; NONDESTRUCTIVE EXAMINATION; SINTERING; X RAY ANALYSIS; X RAY TUBES;

CONTRAST RESOLUTION; PIXEL SIZE; X-RAY MICROTOMOGRAPHY; X-RAY SOURCES;

IMAGING SYSTEMS;

EID: 4944237466     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1776635     Document Type: Article

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