Comparison of SiLi detector and silicon drift detector for the determination of low Z elements in total reflection X-ray fluorescence

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 59, Issue 8, 2004, Pages 1211-1213

  Streli, C ^a   Wobrauschek, P ^a   Schraik, I ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Low energy X rays; SDD; SiLi; TXRF

Indexed keywords

COOLING; DETECTORS; ELECTRON TRAPS; FLUORESCENCE; MONOCHROMATORS; MULTILAYERS; SILICON WAFERS; X RAY ANALYSIS;

ELECTRICAL COOLING; LOW ENERGY X-RAYS; SILICON DRIFT DETECTORS (SDD); TOTAL REFLECTION X-RAY FLUORESCENCE (TXRF);

SILICON COMPOUNDS;

EID: 4644227839     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2004.01.018     Document Type: Conference Paper

References (6)

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