Quick atomic-scale structure imaging by synchrotron x-rays: A new tool for probing realistic inhomogeneous systems

Nanotechnology

Volumn 15, Issue 6, 2004, Pages

  Sakurai, Kenji ^a   Mizusawa, Mari ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTALLIZATION; FLUORESCENCE; IMAGE QUALITY; IMAGING TECHNIQUES; X RAYS;

ATOMIC-SCALE STRUCTURES; MICROBEAMS; X-RAY ABSORPTION FINE STRUCTURE (XAFS); X-RAY FLUORESCENCE (XRF);

SYNCHROTRON RADIATION;

EID: 3042651378     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/6/021     Document Type: Conference Paper

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