Development of background reduced Fresnel phase zone plate

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 4023-4025

  Tamari, Yohei ^a   Azechi, Hiroshi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; OPTIMIZATION; PHOTONS; PLASMA CONFINEMENT; PLASMA DENSITY; PLASMA STABILITY; SIGNAL TO NOISE RATIO; X RAY DIFFRACTION ANALYSIS;

ADVANCED KIRKPATRICK-BAEZ (AKB) MICROSCOPES; FRESNEL PHASE ZONE PLATES (FPZP); SIGNAL TO BACKGROUND RATIO; X RAY IMAGING;

IMAGING SYSTEMS;

EID: 9944250056     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1791335     Document Type: Conference Paper

References (5)

1. B. A. Remington et al., Rev. Sci. Instrum. 63, 5080 (1992).
2. F. J. Marshall and Q. Su, Rev. Sci. Instrum. 66, 725 (1994).
3. R. Kodama et al., Rev. Sci. Instrum. 68, 824 (1997).
4. G. Cauchon et al., Rev. Sci. Instrum. 69, 3186 (1998).
5. Y. Tamari and H. Azechi, IFSA02 Proceedings (2001), p. 871.