EPMA analysis of insulating materials: Monte Carlo simulations and experiments

Journal of Physics D: Applied Physics

Volumn 38, Issue 8, 2005, Pages 1239-1247

  Ghorbel, N ^a,b   Fakhfakh, S ^a,b   Jbara, O ^a   Odof, S ^a   Rondot, S ^b   Fakhfakh, Z ^b   Kallel, A ^a,b,c  

^a CNRS   (France)

^b Faculté des Sciences de Sfax   (Tunisia)

^c ESIEC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; IRRADIATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; X RAYS;

BINARY OXIDES; REALISTIC MODEL; X-RAY INTENSITIES; X-RAY PRODUCTION;

OXIDES;

EID: 24144434079     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/8/022     Document Type: Article

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