Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Journal of Synchrotron Radiation

Volumn 12, Issue 4, 2005, Pages 530-533

  Sekioka, Tsuguhisa ^a   Hayashi, Kouichi ^b   Matsubara, Eiichiro ^b   Takahashi, Yukio ^c   Hayashi, Tetsutaro ^c   Terasawa, Mititaka ^a   Mitamura, Tohru ^a   Iwase, Akihiro ^d   Michikami, Osamu ^e  

^a UNIVERSITY OF HYOGO   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d Osaka Prefecture University   (Japan)

^e IWATE UNIVERSITY   (Japan)

Author keywords

High Tc superconductor; Radiation damage; Synchrotron radiation; X ray fluorescence holography

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; EPITAXIAL GROWTH; EUROPIUM COMPOUNDS; GRAPHITE; HIGH TEMPERATURE SUPERCONDUCTORS; HOLOGRAPHY; IMAGING SYSTEMS; RADIATION DAMAGE; SYNCHROTRON RADIATION; THIN FILMS; X RAY ANALYSIS;

ATOMIC IMAGING; IRRADIATION EFFECTS; X-RAY FLUORESCENCE HOLOGRAPHY;

SUPERCONDUCTING FILMS;

EUROPIUM;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; HOLOGRAPHY; INSTRUMENTATION; METHODOLOGY; SPECTROMETRY;

CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; EUROPIUM; HOLOGRAPHY; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; SPECTROMETRY, X-RAY EMISSION;

EID: 23844489177     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049505006497     Document Type: Conference Paper

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