Measurement of X-ray emission efficiency for K-lines

Microscopy and Microanalysis

Volumn 10, Issue 4, 2004, Pages 481-490

  Procop, M ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Electron probe microanalysis; EPMA; Standardless analysis; X ray emission; X ray spectrometry; X ray yield

Indexed keywords

EID: 4444378529     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040139     Document Type: Article

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