Synchrotron micro-X-ray fluorescence analysis of natural diamonds: First steps in identification of mineral inclusions in situ

American Mineralogist

Volumn 90, Issue 11-12, 2005, Pages 1740-1747

  Sitepu, Husin ^a,b   Kopylova, Maya G ^a   Quirt, David H ^c   Cutler, Jeffrey N ^d   Kotzer, Thomas G ^d  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^c SASKATCHEWAN RESEARCH COUNCIL   (Canada)

^d CANADIAN LIGHT SOURCE INC   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; DIAMONDS; FLUORESCENCE; INDICATORS (CHEMICAL); MINERALS; X RAY ABSORPTION; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

ADVANCED PHOTON SOURCE; ARGONNE NATIONAL LABORATORY; CHEMICAL COMPOSITIONS; HIGH RESOLUTION MAPS; INCLUSIONS IN DIAMOND; KIMBERLITE INDICATOR MINERALS; MICRO X-RAY FLUORESCENCE; TRANSMITTED LIGHT MICROSCOPY;

DIAMOND DEPOSITS;

DIAMOND; INCLUSION; MANTLE CHEMISTRY; X-RAY FLUORESCENCE;

EID: 30644465174     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2005.1960     Document Type: Article

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