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Volumn 147, Issue 3, 2004, Pages 125-133

Quantitative analysis of thin specimens in the TEM using a φ(ρz)-model

Author keywords

Analytical TEM; Microanalysis; Thin film

Indexed keywords


EID: 21244454335     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00604-004-0181-y     Document Type: Article
Times cited : (9)

References (34)
  • 27
    • 21244433226 scopus 로고
    • Effect of foil thickness on quantification of EDS spectra
    • San Francisco Press, San Francisco
    • Goldstein J I, Williams D B (1989) Effect of foil thickness on quantification of EDS spectra. In proc.: Microbeam Analysis. San Francisco Press, San Francisco pp 501-506
    • (1989) Proc.: Microbeam Analysis , pp. 501-506
    • Goldstein, J.I.1    Williams, D.B.2
  • 30
    • 0011963730 scopus 로고
    • The correction of thin foil microanalysis data for X-ray absorption effects
    • Conference series no. 52. The Institute of Physics, Bristol and London
    • Morris P L, Ball M D, Statham P J (1980) The correction of thin foil microanalysis data for X-ray absorption effects. In: Electron microscopy and analysis. Conference series no. 52. The Institute of Physics, Bristol and London
    • (1980) Electron Microscopy and Analysis
    • Morris, P.L.1    Ball, M.D.2    Statham, P.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.