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Volumn 147, Issue 3, 2004, Pages 125-133
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Quantitative analysis of thin specimens in the TEM using a φ(ρz)-model
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Author keywords
Analytical TEM; Microanalysis; Thin film
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Indexed keywords
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EID: 21244454335
PISSN: 00263672
EISSN: None
Source Type: Journal
DOI: 10.1007/s00604-004-0181-y Document Type: Article |
Times cited : (9)
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References (34)
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