Confocal μ-XRF depth analysis of paint layers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 219-220, Issue 1-4, 2004, Pages 35-40

  Smit Z ^a,b,e   Janssens, K ^c   Proost, K ^c   Langus, I ^d  

^a UNIVERSITY OF LJUBLJANA   (Slovenia)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d National Museum of Slovenia   (Slovenia)

^e Department of Physics   (Slovenia)

Author keywords

Paint layers; Synchrotron radiation; X ray optics

Indexed keywords

ABSORPTION; DETECTORS; FLUORESCENCE; LIGHT; MICROLENSES; OPTICAL RESOLVING POWER; PARAMETER ESTIMATION; SCANNING; SILICON COMPOUNDS; SYNCHROTRON RADIATION; X RAY ANALYSIS; X RAY OPTICS;

PAINT LAYERS; SPACE RESOLUTION; X-RAY LENS;

PAINT;

EID: 2342646199     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.024     Document Type: Conference Paper

References (5)

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