The capabilities of an electrically cooled energy-dispersive x-ray detector for quantitative x-ray fluorescence analysis

X-Ray Spectrometry

Volumn 33, Issue 2, 2004, Pages 107-111

  Kump, P ^a   Necemer M ^a   Drinovec, J ^b  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b RADENSKA   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DIODES; SENSITIVITY ANALYSIS; UNCERTAINTY ANALYSIS; X RAY DETECTORS;

ANALYSIS SYSTEM; ENERGY DISPERSIVE X-RAY; ENERGY-DISPERSIVE X-RAYS; EXCITATION SOURCES; LIMIT OF DETECTION; PIN DETECTOR; RADIOISOTOPE EXCITATION; STANDARD REFERENCE MATERIAL; X RAY FLUORESCENCE ANALYSIS; X-RAY DETECTOR;

FLUORESCENCE;

EID: 1642294247     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.714     Document Type: Article

References (5)

1. Huber AC, Pantazis JA. Nucl. Instrum. Methods B 1995; 99: 665.
2. Van Espen PJM, Janssens KHA. In Handbook of X-ray Spectroscopy; Methods and Techniques, Van Grieken RE, Markowicz AA (eds). Marcel Dekker: New York, 1993; 222.
3. QXAS. International Atomic Energy Agency: Vienna, 1992.
4. Markowicz AA, Van Grieken RE. In Handbook of X-ray Spectroscopy; Methods and Techniques, Van Grieken RE, Markowicz AA (eds). Marcel Dekker: New York, 1993; 469.
5. Kump P. Spectrochim. Acta, Part B 1997; 52: 405.