High-energy PIXE using very energetic protons: Quantitative analysis and cross-sections

X-Ray Spectrometry

Volumn 34, Issue 4, 2005, Pages 376-380

  Denker, A ^a   Bohne, W ^a   Campbell, J L ^b   Heide, P ^c   Hopman, T ^b   Maxwell, J A ^b   Opitz Coutureau, J ^a   Rauschenberg, J ^a,c   Rohrich J ^a   Strub, E ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF GUELPH   (Canada)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS;

CERTIFIED VALUES; ENERGETIC PROTONS; HEAVY ELEMENTS; HIGH ENERGY PROTON; HIGH-ENERGY PIXE; K-LINES; LARGE PENETRATIONS; METAL TARGET; PROTON ENERGY; QUALITATIVE ANALYSIS;

CHEMICAL ELEMENTS;

EID: 22644432786     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.842     Document Type: Conference Paper

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