Reliability of microtechnology: Interconnects, devices and systems

Reliability of Microtechnology: Interconnects, Devices and Systems

Volumn , Issue , 2011, Pages 1-204

  Liu, Johan ^a,b   Salmela, Olli ^c   Särkkä, Jussi ^c   Morris, James E ^d   Tegehall, Per Erik ^e   Andersson, Cristina ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b SHANGHAI UNIVERSITY   (China)

^c NOKIA SIEMENS NETWORKS   (Finland)

^d Department of Electrical and Computer Engineering   (United States)

^e SWEREA IVF   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891462975     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-4419-5760-3     Document Type: Book

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