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Volumn , Issue , 2003, Pages 680-684

Mechanical tensile fracture behaviors of solid-state-annealed eutectic SnPb and lead-free solder flip chip bumps

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BRITTLE FRACTURE; EMBRITTLEMENT; EUTECTICS; INTEGRATED CIRCUIT MANUFACTURE; INTERFACES (MATERIALS); MICROSTRUCTURE; SILVER; SOLDERING ALLOYS; TEMPERATURE; TIN ALLOYS;

EID: 0037674773     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (14)
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    • Abtew, M.1    Selvaduray, G.G.2
  • 6
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    • Direct correlation between microstructure and mechanical tensile properties in Pb-free solders and eutectic SnPb solder for flip chip technology
    • Jang, J. W., De Silva, A. P., Lee, T. Y., Lin, J. K., and Frear, D. R., "Direct correlation between Microstructure and Mechanical Tensile Properties in Pb-free Solders and Eutectic SnPb Solder for Flip Chip Technology," Appl. Phys. Lett., Vol. 79, No. 4 (2001), pp. 482-484.
    • (2001) Appl. Phys. Lett. , vol.79 , Issue.4 , pp. 482-484
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  • 7
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    • Pb-free solder for flip chip interconnects
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    • (2001) JOM , vol.53 , Issue.6 , pp. 28-32,38
    • Frear, D.R.1    Jang, J.W.2    Lin, J.K.3    Zhang, C.4
  • 8
    • 0000688716 scopus 로고
    • Suppression of microstructural coarsening and creep deformation in lead-free solder
    • McCormack, M., Jin, S., Kammlott G. W., and Chen, H. S., "Suppression of Microstructural Coarsening and Creep Deformation in Lead-free Solder," Appl. Phys. Lett., Vol. 64, No. 5 (1994), pp.580-582.
    • (1994) Appl. Phys. Lett. , vol.64 , Issue.5 , pp. 580-582
    • McCormack, M.1    Jin, S.2    Kammlott, G.W.3    Chen, H.S.4
  • 9
    • 0033893378 scopus 로고    scopus 로고
    • High strength and high-fatigue resistant lead-free solder
    • Hwang, J. S., Guo, Z., and Koenigsmann, H., "High Strength and High-fatigue Resistant Lead-free Solder," Surface Mount and Technology, Vol. 14, No. 3 (2000), pp. 55-56.
    • (2000) Surface Mount and Technology , vol.14 , Issue.3 , pp. 55-56
    • Hwang, J.S.1    Guo, Z.2    Koenigsmann, H.3
  • 10
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    • Modern Solder Technology for competitive electronics manufacturing
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    • Hwang, J.S.1
  • 11
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    • Microstructure evolution of eutectic Sn-Ag solder joints
    • Yang, W. and Messler, Jr., R. W., "Microstructure Evolution of Eutectic Sn-Ag Solder Joints," J. Electron. Mater., Vol. 23, No. 8, (1994), pp.765-772.
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    • Jang, J. W., Frear, D. R., Lee, T. Y., and Tu, K. N., "Morphology of interfacial reaction between lead-free solders and electroless Ni-P under bump metallization," J. Appl. Phys., Vol. 88, No. 11 (2000), pp. 6359-6363.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.